Julien Buckley

Dr. Julien Buckley

University Grenoble Alpes, CEA, LETI
orcid

Research Focus & Metrics

Academic Career Length

22Years (2005-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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14 October 2013 in Scientific Reports
Verified
Journal Article
Open access
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SLShibing Long
Shibing Long
LPLuca Perniola
Luca Perniola
CCCarlo Cagli
Carlo Cagli
Julien BuckleyJulien Buckley
Julien Buckley
XLXiaojuan Lian
Xiaojuan Lian
Jordi SuñéJordi Suñé
Jordi Suñé
Resistive switching (RS) based on the formation and rupture of conductive filament (CF) is promising in novel memory and logic device applications. Understanding the physics of RS and the nature of CF is of utmost importance to control the performance, variability and reliability of resistive switching memory (RRAM). Here, the RESET switching of HfO2-based RRAM was statistically investigated in terms of the CF conductance evolution. The RESET usually combines an abrupt conductance drop with a progressive phase ending with the complete CF rupture. RESET1 and RESET2 events, corresponding to the initial and final phase of RESET, are found to be controlled by the voltage and power in the CF, respectively. A Monte Carlo simulator based on the thermal dissolution model of unipolar RESET reproduces all of the experimental observations. The results contribute to an improved physics-based understanding on the switching mechanisms and provide additional support to the thermal dissolution model.

3 April 2009 in Chemphyschem
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Journal Article
Closed access
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KHKai Huang
Kai Huang
FDFlorence Duclairoir
Florence Duclairoir
TPTiziana Pro
Tiziana Pro
Julien BuckleyJulien Buckley
Julien Buckley
GMGilles Marchand
Gilles Marchand
FVFrançoise Vinet
Françoise Vinet

4 June 2005 in Microelectronic Engineering
Verified
Journal Article
Closed access
Julien BuckleyJulien Buckley
Julien Buckley
BSB. De Salvo
B. De Salvo
DDD. Deleruyelle
D. Deleruyelle
MGM. Gely
M. Gely
GNGiuseppe Nicotra
Giuseppe Nicotra
SDS. Deleonibus
S. Deleonibus

1 December 2011
Verified
Conference Paper
Closed access
CCC. Cagli
C. Cagli
Julien BuckleyJulien Buckley
Julien Buckley
VJV. Jousseaume
V. Jousseaume
TCT. Cabout
T. Cabout
ASA. Salaun
A. Salaun
BSB. de Salvo
B. de Salvo
In this work, the impact of Ti electrodes on the electrical behaviour of HfO 2 -based RRAM devices is conclusively clarified. To this aim, devices with Pt, TiN and Ti electrodes have been fabricated (see Fig. 1). We first provide several experiments to clearly demonstrate that switching is driven by creation-disruption of a conductive filament. Thus, the role of TiN/Ti electrodes is explained and modeled based on the presence of HfO x interfacial layer underneath the electrode. In addition, Ti is found responsible to activate bipolar switching. Moreover, it strongly reduces forming and switching voltages with respect to Pt-Pt devices. Finally, it positively impacts on retention. To support and interpret our results we provide physico-chemical measurements, electrical characterization, ab-initio calculations and modeling.

1 December 2008
Verified
Conference Paper
Closed access
TET. Ernst
T. Ernst
LDL. Duraffourg
L. Duraffourg
CDC. Dupre
C. Dupre
EBE. Bernard
E. Bernard
PAP. Andreucci
P. Andreucci
OFO. Faynot
O. Faynot
Both CMOS scaling and NEMS sensor devices scaling converge to the same type of sub 100 nm objects. This opens new fields of application for IC chips integrating both complex signal treatment and very highly sensitive sensing functionalities.

1 July 2011 in Microelectronic Engineering
Verified
Journal Article
Closed access
STS. Tirano
S. Tirano
LPL. Perniola
L. Perniola
Julien BuckleyJulien Buckley
Julien Buckley
JCJ. Cluzel
J. Cluzel
VJV. Jousseaume
V. Jousseaume
GRG. Reimbold
G. Reimbold