Prof. Liang-Chia Chen
Distinguished Professor, National Taiwan University
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Academic Career Length
73Years (1954-Present)
(Calculated once Scilit publication data is synced: current year − year of first publication + 1)
Representative Publications
View All Publications1 April 2005 in Journal of Crystal Growth
Journal Article
1 June 2005 in Journal of Nanoparticle Research
Journal Article
CLChih-Hung Lo
Chih-Hung LoTTTsing-Tshih Tsung
Tsing-Tshih Tsung
Liang-Chia ChenCSChun-His Su
Chun-His Su
HLHong-Ming Lin
Hong-Ming Lin
16 February 2021 in Measurement Science and Technology
Journal Article
Yuki ShimizuLiang-Chia ChenDKDaewook Kim
Daewook Kim
Xiuguo ChenXLXinghui Li
Xinghui Li
HMHiraku Matsukuma
Hiraku MatsukumaOptical metrology is one of the key technologies in today’s manufacturing industry. In this article, we provide an insight into optical measurement technologies for precision positioning and quality assessment in today’s manufacturing industry. First, some optical measurement technologies for precision positioning are explained, mainly focusing on those with a multi-axis positioning system composed of linear slides, often employed in machine tools or measuring instruments. Some optical measurement technologies for the quality assessment of products are then reviewed, focusing on technologies for form measurement of products with a large metric structure, from a telescope mirror to a nanometric structure such as a semiconductor electrode. Furthermore, we also review the state-of-the-art optical technique that has attracted attention in recent years, optical coherence tomography for the non-destructive inspection of the internal structures of a fabricated component, as well as super-resolution techniques for improving the lateral resolution of optical imaging beyond the diffraction limit of light. This review article provides insights into current and future technologies for optical measurement in the manufacturing industry, which are expected to become even more important to meet the industry’s continuing requirements for high-precision and high-efficiency machining.
23 March 2005 in Measurement Science and Technology
Journal Article
Liang-Chia ChenCHChung-Chih Huang
Chung-Chih Huang
30 November 2007 in Measurement Science and Technology
Journal Article
Liang-Chia ChenCKChia-Cheng Kuo
Chia-Cheng Kuo
5 December 2016 in Optics Letters
Journal Article
A broadband differential confocal method that exploits novel double-slit chromatic confocal microscopy was developed for one-shot microscopic 3D surface measurement. In situ automated optical inspection to generate microscopic surface profiles has become extremely important for ensuring strict geometric compliance in precision manufacturing. An innovative optical configuration was developed to generate a pair of orthogonally polarized incident light beams, and a pair of the conjugate light beams was detected using two slits of different widths at the corresponding conjugate imaging locations of the incident beams. A sub-micrometer depth measuring repeatability can be achieved for the one-shot reconstruction of 3D surface profiles.
About Me
Prof. Liang-Chia Chen is currently working as a distinguished professor in the Department of Mechanical Engineering of National Taiwan University (NTU), Taiwan. He obtained his Ph.D. in advanced manufacturing and mechanical engineering, the University of South Australia in 2000. Prior to embarking on his academic career in Taiwan, he worked as a full-time research engineer in Gerard Industries of Australia (Clipsal) between 1996-2000 and Institute of nuclear energy research (INER) of Taiwan between 1991-1995. Before joining NTU, he worked as a distinguished professor in National Taipei University of Technology between 2001-2009 in Taipei. Up to now, he has received the outstanding research award from the Ministry of Science and Technology (MOST) of Taiwan in 2016, National year invention gold awards consecutively in 2013 & 2014, and the 2014 outstanding award on technology transfer from the MOST. His major research fields are in precision metrology and manufacturing, automated optical inspection (AOI), opto-mechatronics instrumentation and 3-D machine vision and algorithms for automation. In publication, he has published one textbook, three book chapters, more than 120 referred journal papers and 60 invention patents internationally. For academic services, he served as the president of the international committee of measurement and instrumentation (ICMI) between 2015-2017 and currently serves as a steering committee member in ICMI and IMEKO.