Juliusz Chojenka

Dr. Juliusz Chojenka

orcid

Research Focus & Metrics

Academic Career Length

10Years (2017-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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4 May 2021 in Materials
Verified
Journal Article
Open access
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AZArkadiusz Zarzycki
Arkadiusz Zarzycki
JCJuliusz Chojenka
Juliusz Chojenka
MPMarcin Perzanowski
Marcin Perzanowski
MMMarta Marszalek
Marta Marszalek
In this paper, we describe magnetoelectric properties of metal/metal-oxide/metal junctions based on anodized metal oxides. Specifically, we use Ti and Fe metallic layers separated by the porous metal-oxides of iron or titanium formed by the anodization method. Thus, we prepare double junctions with at least one ferromagnetic layer and measure magnetoresistance, as well as their current-voltage and magnetic characteristics. We find that magnetoresistance depends on that junction composition and discuss the nature of differential resistance calculated from I-V characteristics. Our findings show that a top metallic layer and the interface between this layer and anodized oxide, where strong interatomic diffusion is expected, have the strongest influence on this observed behavior.

1 May 2019 in Journal of Magnetism and Magnetic Materials
Verified
Journal Article
Closed access
AMAlexey Maximenko
Alexey Maximenko
MMMarta Marszalek
Marta Marszalek
JCJuliusz Chojenka
Juliusz Chojenka
JFJulia Fedotova
Julia Fedotova
BJBenedykt R. Jany
Benedykt R. Jany
YZY. Zabila
Y. Zabila

27 June 2024 in Acta Materialia
Verified
Journal Article
Open access
MPMarcin Perzanowski
Marcin Perzanowski
JCJuliusz Chojenka
Juliusz Chojenka
ASAleksandra Szkudlarek
Aleksandra Szkudlarek
MKMichal Krupinski
Michal Krupinski

20 September 2017 in Physics of the Solid State
Verified
Journal Article
Closed access
PDF file
AMAlexey Maximenko
Alexey Maximenko
JKJ. V. Kasiuk
J. V. Kasiuk
JFJulia Fedotova
Julia Fedotova
MMMarta Marszalek
Marta Marszalek
YZY. Zabila
Y. Zabila
JCJuliusz Chojenka
Juliusz Chojenka
We studied the structure and magnetic properties of porous multilayered Co/Pd films deposited on the templates of anodized Al2O3 with a specific surface morphology that is characterized by a cellular–porous structure with several pores inside each cell. X-ray diffraction analysis and reflectometry are used to study the peculiarities of the formation of phases in deposited films. The effect of morphological features of porous Co/Pd films on their magnetoanisotropic properties and magnetization reversal processes (magnetization reversal mechanisms, domain structure of films, and coercive field Hc) is revealed by SQUID magnetometry and magnetic force microscopy.

2 January 2024 in The Journal of Physical Chemistry C
Verified
Journal Article
Closed access
JCJuliusz Chojenka
Juliusz Chojenka
AZArkadiusz Zarzycki
Arkadiusz Zarzycki
MPMarcin Perzanowski
Marcin Perzanowski
TFTamás Fodor
Tamás Fodor
KMKrystian Mróz
Krystian Mróz
MMMarta Marszalek
Marta Marszalek

21 September 2022 in Nanotechnology
Verified
Journal Article
Open access
MPMarcin Perzanowski
Marcin Perzanowski
OPO Polit
O Polit
JCJuliusz Chojenka
Juliusz Chojenka
WSWojciech Sas
Wojciech Sas
AZArkadiusz Zarzycki
Arkadiusz Zarzycki
MMMarta Marszalek
Marta Marszalek
Materials exhibiting an exchange bias effect are a class of magnetic systems that have a wide range of possible technological applications e.g. in sensors, read heads, and spintronic devices. In this study, we demonstrate the effect of laser interference patterning on the magnetic properties of Pd/CoO/Co/Pd multilayers. Laser patterning creates arrays of well-ordered stripes, rectangles, and squares on the substrate surface. We found that the laser treatment caused magnetic softening of the structure edges while the centers of the objects remained unchanged and exhibited the exchange bias effect. In this study we focused on the shape and configurational magnetic anisotropies induced by patterning and showed that the magnetic properties varied depending on the angle at which the external magnetic field was applied with respect to the pattern geometry.