Sukhoon Oh received a B.Sc. degree in biomedical engineering from Konkuk University, South Korea, in 1998 and M.Sc. and Ph.D. degrees in biomedical engineering from Kyunghee University, South Korea, in 2002 and 2006, respectively. In 2006, he joined the Center for NMR Research, Pennsylvania State University, PA, USA, as a post-doctoral fellow. From 2008 to 2012, he was a research associate (full-time faculty) at the Department of Radiology, Pennsylvania State University, PA, USA. In 2012, he continued his research at New York University, NY, USA, as a research scientist until he moved to Samsung Electronics, South Korea, in 2013. At Samsung Electronics, he participated in the development projects for a 3 T MRI system. Since 2016, he has been working at Korea Basic Science Institute, South Korea, as a senior researcher. His research interests include the RF safety assessments for high-field MRI systems. For that, he has been conducting various EM field simulations, electric properties mapping, and MR thermometry experiments involving RF coils in phantoms and in vivo.