Faculty of Electrical Engineering and Information Technology Institute of Electronics and Photonics, Slovak University of Technology, Bratislava, Slovakia
Prof. Jaroslav Kovac
Faculty of Electrical Engineering and Information Technology Institute of Electronics and Photonics, Slovak University of Technology, Bratislava, Slovakia
Copper oxide thin films were obtained using pulsating spray pyrolysis method. The morphological, structural, and optical properties of fabricated films were studied. X-ray analysis revealed that the CuO thin films are single-phase. The study of films morphology by SEM and AFM methods showed that the obtained films have a fairly high surface roughness and contain grains of different shapes and sizes. It was found that the obtained films of copper oxide have high values of the absorption coefficient, which confirms the possibility of their use as absorbing layers for solar cells. The obtained values of the optical band gap of the material are in the range from 1.45 eV to 1.60 eV. Raman spectroscopy revealed three modes A1g, B1g, and B2g, of the crystal structure of monoclinic CuO. The devices based on p-type copper oxide are promising for solar cells fabrication because they can reduce production costs, due to their low cost and inexpensive production methods compared to silicon solar cells fabrication.
In this paper, we report a fabrication, characterization and stability study of p-GaN/n-ZnO nanorod heterojunction light-emitting devices (LEDs). The LEDs were assembled from arrays of n-ZnO vertical nanorods epitaxially grown on p-GaN. LEDs showed bright electroluminescence in blue (440 nm), although weaker violet (372 nm) and green-yellow (550 nm) spectral components were also observed. The device characteristics are generally stable and reproducible. The LEDs have a low turn-on voltage (∼5 V). The electroluminescence (EL) is intense enough to be noticed by the naked eye, at an injection current as low as ∼ 40 µA (2.1 × 10(-2) A cm(-2) at 7 V bias). Analysis of the materials, electrical and EL investigations point to the role of a high quality of p-n nano-heterojunction which facilitates a large rectification ratio (320) and a stable reverse current of 2.8 µA (1.4 × 10(-3) A cm(-2) at 5 V). Stability of EL characteristics was investigated in detail. EL intensity showed systematic degradation over a short duration when the LED was bias-stressed at 30 V. At smaller bias (<20 V) LEDs tend to show a stable and repeatable EL characteristic. Thus a simple low temperature solution growth method was successfully exploited to realize nanorod/film heterojunction LED devices with predictable characteristics.