With the recent developments in secondary ion mass spectrometry (SIMS), it is now possible to obtain molecular depth profiles and 3D molecular images of organic thin films, i.e. SIMS depth profiles where the molecular information of the mass spectrum is retained through the sputtering of the sample. Several approaches have been proposed for “damageless” profiling, including the sputtering with SF₅ ⁺ and C₆₀ ⁺ clusters, low energy Cs⁺ ions and, more recently, large noble gas clusters (Ar_500–5000 ⁺). In this article, we evaluate the merits of these different approaches for the in depth analysis of organic photovoltaic heterojunctions involving poly(3-hexylthiophene) (P3HT) as the electron donor and [6,6]-phenyl C₆₁ butyric acid methyl ester (PCBM) as the acceptor. It is demonstrated that the use of 30 keV C₆₀ ³⁺ and 500 eV Cs⁺ (500 eV per atom) leads to strong artifacts for layers in which the fullerene derivative PCBM is involved, related to crosslinking and topography development. In comparison, the profiles obtained using 10 keV Ar₁₇₀₀ ⁺ (∼6 eV per atom) do not indicate any sign of artifacts and reveal fine compositional details in the blends. However, increasing the energy of the Ar cluster beam beyond that value leads to irreversible damage and failure of the molecular depth profiling. The profile qualities, apparent interface widths and sputtering yields are analyzed in detail. On the grounds of these experiments and recent molecular dynamics simulations, the discussion addresses the issues of damage and crater formation induced by the sputtering and the analysis ions in such radiation-sensitive materials, and their effects on the profile quality and the depth resolution. Solutions are proposed to optimize the depth resolution using either large Ar clusters or low energy cesium projectiles for sputtering and/or analysis.

Ionised cluster beams have been produced and employed for thin film deposition and surface processing for half a century. In the last two decades, kiloelectronvolt cluster ions have also proved to be outstanding for surface characterisation by secondary ion mass spectrometry (SIMS), because their sputter and ion yields are enhanced in a non-linear fashion with respect to monoatomic projectiles, with a resulting step change of sensitivity for analysis and imaging. In particular, large gas cluster ion beams, or GCIB, have now become a reference in organic surface and thin film analysis using SIMS and X-ray photoelectron spectroscopy (XPS). The reason is that they induce soft molecular desorption and offer the opportunity to conduct damageless depth-profiling and 3D molecular imaging of the most sensitive organic electronics and biological samples, with a nanoscale depth resolution. In line with these recent developments, the present review focuses on rather weakly-bound, light-element cluster ions, such as noble or other gas clusters, and water or alcohol nanodroplets (excluding clusters made of metals, inorganic salts or ionic liquids) and their interaction with surfaces (essentially, but not exclusively, organic). The scope of this article encompasses three aspects. The first one is the fundamentals of large cluster impacts with surfaces, using the wealth of information provided by molecular dynamics simulations and experimental observations. The second focus is on recent applications of large cluster ion beams in surface characterisation, including mass spectrometric analysis and 2D localisation of large molecules, molecular depth-profiling and 3D molecular imaging. Finally, the perspective explores cutting edge developments, involving (i) new types of clusters with a chemistry designed to enhance performance for mass spectrometry imaging, (ii) the use of cluster fragment ion backscattering to locally retrieve physical surface properties and (iii) the fabrication of new biosurface and thin film architectures, where large cluster ion beams are used as tools to transfer biomolecules in vacuo from a target reservoir to any collector substrate.

In this study, a bio-derived precipitating agent/ligand, palm kernel oil, has been used as an alternative route for the green synthesis of nanoparticles of Fe-doped Co₃O₄ via the co-precipitation reaction. The palm oil was extracted from dried palm kernel seeds by crushing, squeezing and filtration. The reaction of the palm kernel oil with potassium hydroxide, under reflux, yielded a solution containing a mixture of potassium carboxylate and excess hydroxide ions, irrespective of the length of saponification. The as-obtained solution reacts with an aqueous solution containing iron and cobalt ions to yield the desired metallo-organic precursor, iron cobalt carboxylate. Characterization of the precursors by IR and gas chromatography (GC) attests to the presence of carboxylate fatty acids in good agreement with the proportion contained in the oil, and ICP confirms that the metallic ratios are in the proportion used during the synthesis. Analysis of the products thermally decomposed between 400 °C and 600 °C by XRD, EDX, TEM and ToF-SIMS, established that cobalt iron oxide nanoparticles (Co_(1−x)Fe_x)₃O₄ were obtained for x ≤ 0.2 and a nanocomposite material (Co_(1−x)Fe_x)₃O₄/Fe₃O₄ for x ≥ 0.2, with sizes between 22 and 9 nm. ToF-SIMS and XRD provided direct evidence of the progressive substitution of cobalt by iron in the Co₃O₄ crystal structure for x ≤ 0.2.