This paper provides a tutorial overview over recent vigorous efforts to develop computing systems based on spin waves instead of charges and voltages. Spin-wave computing can be considered a subfield of spintronics, which uses magnetic excitations for computation and memory applications. The Tutorial combines backgrounds in spin-wave and device physics as well as circuit engineering to create synergies between the physics and electrical engineering communities to advance the field toward practical spin-wave circuits. After an introduction to magnetic interactions and spin-wave physics, the basic aspects of spin-wave computing and individual spin-wave devices are reviewed. The focus is on spin-wave majority gates as they are the most prominently pursued device concept. Subsequently, we discuss the current status and the challenges to combine spin-wave gates and obtain circuits and ultimately computing systems, considering essential aspects such as gate interconnection, logic level restoration, input–output consistency, and fan-out achievement. We argue that spin-wave circuits need to be embedded in conventional complementary metal–oxide–semiconductor (CMOS) circuits to obtain complete functional hybrid computing systems. The state of the art of benchmarking such hybrid spin-wave–CMOS systems is reviewed, and the current challenges to realize such systems are discussed. The benchmark indicates that hybrid spin-wave–CMOS systems promise ultralow-power operation and may ultimately outperform conventional CMOS circuits in terms of the power-delay-area product. Current challenges to achieve this goal include low-power signal restoration in spin-wave circuits as well as efficient spin-wave transducers.

Resistive RAM (RRAM) is a promising technology to replace traditional technologies such as Flash, because of its low energy consumption, CMOS compatibility, and high density. Many companies are prototyping this technology to validate its potential. Bringing this technology to the market requires high-quality tests to ensure customer satisfaction. Hence, it is of great importance to deeply understand manufacturing defects and accurately model them to develop optimal tests. This paper presents a holistic framework for defect and fault modeling that enables the development of optimal tests for RRAMs. An overview and classification of RRAM manufacturing defects are provided. Defects in contacts and interconnects are modeled as resistors. Unique RRAM defects, e.g., forming defects, require Device-Aware defect modeling which incorporates the defect’s impact on the device’s electric properties by adjusting the affected technology and electrical parameters. Additionally, a systematic approach to define the fault space is presented, followed by a methodology to validate this space. With this methodology, accurate fault modeling for contact, interconnect, and forming defects is performed and tests are developed. The tests are able to detect all faults in a time-efficient manner, thereby proving the effectiveness of the framework. Finally, an outlook on future RRAM testing is presented.

Food profiling is an essential step in any food monitoring system needed to prevent health risks and potential frauds in the food industry. Significant improvements in sequencing technologies are pushing food profiling to become the main computational bottleneck. State-of-the-art profilers are unfortunately too costly for food profiling. Our goal is to design a food profiler that solves the main limitations of existing profilers, namely (1) working on massive data structures and (2) incurring considerable data movement, for a real-time monitoring system. To this end, we propose Demeter, the first platform-independent framework for food profiling. Demeter overcomes the first limitation through the use of hyperdimensional computing (HDC) and efficiently performs the accurate few-species classification required in food profiling. We overcome the second limitation by the use of an in-memory hardware accelerator for Demeter (named Acc-Demeter) based on memristor devices. Acc-Demeter actualizes several domain-specific optimizations and exploits the inherent characteristics of memristors to improve the overall performance and energy consumption of Acc-Demeter. We compare Demeter’s accuracy with other industrial food profilers using detailed software modeling. We synthesize Acc-Demeter’s required hardware using UMC’s 65nm library by considering an accurate PCM model based on silicon-based prototypes. Our evaluations demonstrate that Acc-Demeter achieves a (1) throughput improvement of $192\times $ and $724\times $ and (2) memory reduction of $36\times $ and $33\times $ compared to Kraken2 and MetaCache (2 state-of-the-art profilers), respectively, on typical food-related databases. Demeter maintains an acceptable profiling accuracy (within 2% of existing tools) and incurs a very low area overhead.

The research and prototyping of new memory technologies are getting a lot of attention in order to enable new (computer) architectures and provide new opportunities for today’s and future applications. Delivering high quality and reliability products was and will remain a crucial step in the introduction of new technologies. Therefore, appropriate fault modelling, test development and design for testability (DfT) is needed. This paper overviews and discusses the challenges and the emerging solutions in testing three classes of memories: 3D stacked memories, Resistive memories and Spin-Transfer-Torque Magnetic memories. Defects mechanisms, fault models, and emerging test solutions will be discussed.

Faster and cheaper computers have been constantly demanding technological and architectural improvements. However, current technology is suffering from three technology walls: leakage wall, reliability wall, and cost wall. Meanwhile, existing architecture performance is also saturating due to three well-known architecture walls: memory wall, power wall, and instruction-level parallelism (ILP) wall. Hence, a lot of novel technologies and architectures have been introduced and developed intensively. Our previous work has presented a comprehensive classification and broad overview of memory-centric computer architectures. In this article, we aim to discuss the most important classes of memory-centric architectures thoroughly and evaluate their advantages and disadvantages. Moreover, for each class, the article provides a comprehensive survey on memory-centric architectures available in the literature.