Alessandro Magnani

Dr. Alessandro Magnani

orcid

Research Focus & Metrics

Academic Career Length

15Years (2012-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 September 2014
Verified
Conference Paper
Closed access
LCLorenzo Codecasa
Lorenzo Codecasa
Vincenzo D'AlessandroVincenzo D'Alessandro
Vincenzo D'Alessandro
AMAlessandro Magnani
Alessandro Magnani
NRNiccolo Rinaldi
Niccolo Rinaldi
PZPeter J. Zampardi
Peter J. Zampardi
This work describes a Fast novel thermal analysis simulation tool for integrated circuits (FANTASTIC), which is fully automated and relies on an enhanced version of the Multi-Point Moment Matching algorithm. The tool provides a novel equivalent network suitable for use in SPICE-like circuit simulators to perform efficient thermal and electrothermal analyses. FANTASTIC requires much less CPU time and memory storage compared to commercial simulators. The thermal behavior of a state-of-the-art four-finger GaAs HBT is investigated as a case-study.

26 October 2015 in IEEE Transactions on Power Electronics
Verified
Journal Article
Closed access
LCLorenzo Codecasa
Lorenzo Codecasa
VDVincenzo Dalessandro
Vincenzo Dalessandro
AMAlessandro Magnani
Alessandro Magnani
Andrea IraceAndrea Irace
Andrea Irace
This paper presents an efficient circuit-based approach for the nonlinear dynamic electrothermal simulation of power devices and systems subject to radical self-heating. The strategy relies on the synthesis of a nonlinear compact thermal network extracted from a finite-element model by a novel model-order reduction method requiring a computational time orders of magnitude lower than conventional techniques. Unlike commonly employed approaches, the proposed network allows reconstructing the whole time evolution of the temperature field in all the points of the domain with high accuracy. Electrothermal simulations are enabled in a commercial SPICE-like simulator by coupling such a network with subcircuits that describe the electrical device behavior by accounting for the temperature dependence of the key physical parameters. As a case study, the dynamic electrothermal analysis of a packaged silicon carbide power MOSFET undergoing a short-circuit test is performed, showcasing the performance of the approach and highlighting the need of including the thermal nonlinearities to achieve reliable results.

1 June 2014
Verified
Conference Paper
Closed access
Vincenzo D'AlessandroVincenzo D'Alessandro
Vincenzo D'Alessandro
AMAlessandro Magnani
Alessandro Magnani
Michele RiccioMichele Riccio
Michele Riccio
Giovanni BreglioGiovanni Breglio
Giovanni Breglio
Andrea IraceAndrea Irace
Andrea Irace
Alberto CastellazziAlberto Castellazzi
Alberto Castellazzi
This paper presents a computationally efficient 3-D simulation approach for the dynamic electrothermal analysis of SiC power MOSFETs. The strategy relies on a circuit representation of the whole device, where the electrothermal feedback is enabled through an equivalent electrical network, and the elementary device cell is described by a novel behavioral model accounting for the non-intuitive temperature dependences of key physical parameters.

1 September 2015
Verified
Conference Paper
Closed access
LCLorenzo Codecasa
Lorenzo Codecasa
VDVincenzo D'Alessandro
Vincenzo D'Alessandro
AMAlessandro Magnani
Alessandro Magnani
NRNiccolo Rinaldi
Niccolo Rinaldi
A novel matrix reduction method for the efficient and automatic construction of boundary condition independent dynamic compact thermal models having a chosen accuracy, is proposed. The method is implemented in a code which allows constructing boundary condition independent dynamic compact thermal models of any multi-die package modeled within a 3-D commercial mesher. The proposed approach has many advantages with respect to previous approaches in terms of robustness, efficiency, and applicability. The method is validated through the analysis of a dual-flat no-leads 12-leads package.

23 September 2014 in IEEE Transactions on Components, Packaging and Manufacturing Technology
Verified
Journal Article
Closed access
LCLorenzo Codecasa
Lorenzo Codecasa
Vincenzo D'AlessandroVincenzo D'Alessandro
Vincenzo D'Alessandro
AMAlessandro Magnani
Alessandro Magnani
NRNiccolo Rinaldi
Niccolo Rinaldi
A novel nonlinear model order reduction method is proposed for constructing one-port dynamic compact models of nonlinear heat diffusion problems for ultra-thin chip stacking technology. The method leads to models of small state-space dimensions, which allow accurately reconstructing the whole time evolution of the temperature field due to an arbitrary power waveform of practical interest. The approach is also efficient, since the computational time/memory requirements for constructing each dynamic compact model is about one order of magnitude lower than that corresponding to a single 3-D finite element method transient simulation of a nonlinear problem.

1 September 2013 in Microelectronics Reliability
Verified
Journal Article
Closed access
Vincenzo D'AlessandroVincenzo D'Alessandro
Vincenzo D'Alessandro
AMAlessandro Magnani
Alessandro Magnani
Michele RiccioMichele Riccio
Michele Riccio
YIYohei Iwahashi
Yohei Iwahashi
Giovanni BreglioGiovanni Breglio
Giovanni Breglio
Andrea IraceAndrea Irace
Andrea Irace