Jinsang Kim

Prof. Dr. Jinsang Kim

Kyung Hee University, Yongin, Gyeonggi-do, Republic of Korea

Research Focus & Metrics

Academic Career Length

18Years (2009-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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12 April 2023 in IEEE Transactions on Circuits and Systems II: Express Briefs
Verified
Journal Article
Closed access
YKYoung-Min Kang
Young-Min Kang
JPJung-Jin Park
Jung-Jin Park
GKGeon-Hak Kim
Geon-Hak Kim
ICIk-Joon Chang
Ik-Joon Chang
JKJinsang Kim
Jinsang Kim
With aggressive scaling down in integrated circuit technology, the design of double-node-upset (DNU)-resilient latches have become a major issue regarding radiation hardening by design (RHBD). The conventional DNU-resilient latches are mostly based on the Muller C-element (MCE) and the dual-interlocked storage cell (DICE) element, which exhibit severe limitations: charge sharing during the read operation at a system level and large power consumption. Overcoming these limitations, this brief proposes a DNU-resilient latch based on a novel latch element. The proposed latch fully exploits upset polarity awareness, achieving the maximum number of single-event upset (SEU)-insensitive nodes. We develop a novel double modular redundancy architecture for the DNU-resilient latch design with one SEU-immune module. Based on simulation results, the proposed latch achieves up to 27.6X average power-delay-area-product (PDAP) improvement over state-of-the-art DNU-resilient latches.

18 December 2009 in Annals of Telecommunications
Verified
Journal Article
Closed access
PDF file
MIMohammad Rakibul Islam
Mohammad Rakibul Islam
JKJinsang Kim
Jinsang Kim

8 August 2022 in Electronics
Verified
Journal Article
Open access
PDF file
JPJung-Jin Park
Jung-Jin Park
YKYoung-Min Kang
Young-Min Kang
GKGeon-Hak Kim
Geon-Hak Kim
ICIk-Joon Chang
Ik-Joon Chang
JKJinsang Kim
Jinsang Kim
Due to aggressive scaling down, multiple-node-upset hardened design has become a major concern regarding radiation hardening. The proposed latch overcomes the architecture and performance limitations of state-of-the-art double-node-upset (DNU)-resilient latches. A novel stacked latch element is developed with multiple thresholds, regular architecture, increased number of single-event upset (SEU)-insensitive nodes, low power dissipation, and high robustness. The radiation-aware layout considering layout-level issues is also proposed. Compared with state-of-the-art DNU-resilient latches, simulation results show that the proposed latch exhibits up to 92% delay and 80% power reduction in data activity ratio (DAR) of 100%. The radiation simulation using the dual-double exponential current source model shows that the proposed latch has the strongest radiation-hardening capability among the other DNU-resilient latches.

24 January 2013 in IEEE Transactions on Circuits and Systems for Video Technology
Verified
Journal Article
Closed access
MCMinsu Choi
Minsu Choi
ICIk-Joon Chang
Ik-Joon Chang
JKJinsang Kim
Jinsang Kim
Multiview video coding (MVC) provides more realistic 3-D scenes adding depth information derived from multiple cameras than single-or stereo-view video coding. In MVC, video frames obtained from each view are simply scheduled to corresponding encoding channels. However, under such a conventional scheduling technique the encoding times of each channel may not be identical, degrading encoding performance. To address this problem, this paper proposes two MVC frame scheduling schemes and their architectures: a hardware resource aware scheduling and a frame waiting time aware scheduling (WTaS). Here, WTaS considers the waiting time of each frame stored in on-chip SRAM during frame scheduling, thereby reducing SRAM size significantly. Experimental results show that the proposed frame scheduling schemes provide 29.4% faster processing time, compared to the conventional counterpart. In addition, we can improve the core area, on-chip SRAM area, and the power dissipation by 26.7%, 23.2%, and 26.6%, respectively.