Felix Chukhovskii

Prof. Dr. Felix Chukhovskii

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Research Focus & Metrics

Academic Career Length

16Years (2011-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 November 2018 in Journal of Applied Crystallography
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VAVictor Asadchikov
Victor Asadchikov
ABAlexey Buzmakov
Alexey Buzmakov
Felix ChukhovskiiFelix Chukhovskii
Felix Chukhovskii
IDIrina Dyachkova
Irina Dyachkova
DZDenis Zolotov
Denis Zolotov
ESErnest Suvorov
Ernest Suvorov


2 October 2019 in Scientific Reports
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Felix ChukhovskiiFelix Chukhovskii
Felix Chukhovskii
PKPeter Konarev
Peter Konarev
VVVladimir Vladimirovich Volkov
Vladimir Vladimirovich Volkov
A successive approach to the solution of the inverse problem of the X-ray diffraction tomography (XRDT) is proposed. It is based on the semi-kinematical solution of the dynamical Takagi–Taupin equations for the σ-polarized diffracted wave amplitude. Theoretically, the case of the Coulomb-type point defect in a single crystal Si(111) under the exact conditions of the symmetric Laue diffraction for a set of the tilted X-ray topography 2D-images (2D projections) is considered provided that the plane-parallel sample is rotated around the diffraction vector [ $$\bar{{\bf{2}}}$$ 2 ¯ 20]. The iterative simulated annealing (SA) and quasi-Newton gradient descent (qNGD) algorithm codes are used for a recovery of the 3D displacement-field function of the Coulomb-type point defect. The computer recovery data of the 3D displacement-field function related to the one XRDT 2D projection are presented. It is proved that the semi-kinematical approach to the solution of the dynamical Takagi–Taupin equations is effective for recovering the 3D displacement-field function even for the one XRDT 2D projection.

1 March 2019 in Crystallography Reports
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PKPeter Konarev
Peter Konarev
Felix ChukhovskiiFelix Chukhovskii
Felix Chukhovskii
VVV. V. Volkov
V. V. Volkov
A successive approach to the solution of the inverse problem of diffraction X-ray topo-tomography is proposed. It is based on the semikinematic solution to the Takagi–Taupin equations for the...

24 March 2023 in Crystals
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Felix ChukhovskiiFelix Chukhovskii
Felix Chukhovskii
PKPeter Konarev
Peter Konarev
VVVladimir Vladimirovich Volkov
Vladimir Vladimirovich Volkov
A central point of validity of computer X-ray diffraction micro tomography is to improve the digital contrast and spatial resolution of the 3D-recovered nano-scaled objects in crystals. In this respect, the denoising issue of the 2D image patterns data involved in the 3D high-resolution recovery processing has been treated. The Poisson-noise simulation of 2D image patterns data was performed; afterwards, it was employed for recovering nano-scaled crystal structures. By using the statistical average and geometric means methods of the acquired 2D image frames, we showed that the statistical average hypothesis works well, at least in the case of 2D Poisson-noise image data related to the Coulomb-type point defect in a crystal Si(111). The validation of results related to the de-noised 2D IPs data obtained was carried out by both the 3D recovery processing of the Coulomb-type point defect in a crystal Si(111) and using the peak signal-to-noise ratio (PSNR) criterion.

10 March 2011 in Acta Crystallographica Section A Foundations of Crystallography
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Felix ChukhovskiiFelix Chukhovskii
Felix Chukhovskii