Denis was born in Dzerzhinsky, Moscow Region, Russia, and went to the Moscow State Institute of Electronics and Mathematics (Technical University), where he obtained his Master's degree in microelectronics engineering specialization in 2007. Since 2005 he has been working at the Institute of Crystallography (FSRC "Crystallography and Photonics" RAS). He received a Ph.D. degree in Physics of Crystallography in 2011. His fields of interest are crystallography, X-ray imaging, microtomography, topography, and X-ray optics. He is a co-author of more than 50 scientific publications.
Denis was born in Dzerzhinsky, Moscow Region, Russia, and went to the Moscow State Institute of Electronics and Mathematics (Technical University), where he obtained his Master's degree in microelectronics engineering specialization in 2007. Since 2005 he has been working at the Institute of Crystallography (FSRC "Crystallography and Photonics" RAS). He received a Ph.D. degree in Physics of Crystallography in 2011. His fields of interest are crystallography, X-ray imaging, microtomography, topography, and X-ray optics. He is a co-author of more than 50 scientific publications.