Miroslav Mikolášek

Dr. Miroslav Mikolášek

Faculty of Electrical Engineering and Information Technology, Institute of Electronics and Photonics, Slovak University of Technology in Bratislava, Ilkovicova 3, 812 19 Bratislava, Slovakia
orcid

Research Focus & Metrics

Academic Career Length

19Years (2008-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 April 2020 in Journal of Electroanalytical Chemistry
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Journal Article
Closed access
VRVlastimil Rehacek
Vlastimil Rehacek
IHI. Hotovy
I. Hotovy
MMM. Marton
M. Marton
Miroslav MikolášekMiroslav Mikolášek
Miroslav Mikolášek
PMPavol Michniak
Pavol Michniak
MVMarian Vojs
Marian Vojs

1 April 2021 in Applied Surface Science
Verified
Journal Article
Closed access
IHIvan Hotovy
Ivan Hotovy
Lothar SpiessLothar Spiess
Lothar Spiess
Miroslav MikolášekMiroslav Mikolášek
Miroslav Mikolášek
IKI. Kostic
I. Kostic
MSMichaela Sojkova
Michaela Sojkova
VRV. Rehacek
V. Rehacek

1 April 2014 in Solid-State Electronics
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Journal Article
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JMJuraj Marek
Juraj Marek
ACAleš Chvála
Aleš Chvála
DDDaniel Donoval
Daniel Donoval
PPPatrik Príbytný
Patrik Príbytný
MMMarián Molnár
Marián Molnár
Miroslav MikolášekMiroslav Mikolášek
Miroslav Mikolášek

1 December 2018 in Optik
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Journal Article
Closed access
MKMagdaléna Kadlečíková
Magdaléna Kadlečíková
JBJuraj Breza
Juraj Breza
ĽVĽ. Vančo
Ľ. Vančo
Miroslav MikolášekMiroslav Mikolášek
Miroslav Mikolášek
MHMichal Hubeňák
Michal Hubeňák
JGJán Greguš
Ján Greguš

20 December 2022 in Materials
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Journal Article
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EDEdmund Dobročka
Edmund Dobročka
Filip GucmannFilip Gucmann
Filip Gucmann
KHKristína Hušeková
Kristína Hušeková
PNPeter Nádaždy
Peter Nádaždy
FHFedor Hrubišák
Fedor Hrubišák
Milan TapajnaMilan Tapajna
Milan Tapajna
We report on crystal structure and thermal stability of epitaxial ε/κ-Ga2O3 thin films grown by liquid-injection metal–organic chemical vapor deposition (LI-MOCVD). Si-doped Ga2O3 films with a thickness of 120 nm and root mean square surface roughness of ~1 nm were grown using gallium-tetramethylheptanedionate (Ga(thd)3) and tetraethyl orthosilicate (TEOS) as Ga and Si precursor, respectively, on c-plane sapphire substrates at 600 °C. In particular, the possibility to discriminate between ε and κ-phase Ga2O3 using X-ray diffraction (XRD) φ-scan analysis or electron diffraction analysis using conventional TEM was investigated. It is shown that the hexagonal ε-phase can be unambiguously identified by XRD or TEM only in the case that the orthorhombic κ-phase is completely suppressed. Additionally, thermal stability of prepared ε/κ-Ga2O3 films was studied by in situ and ex situ XRD analysis and atomic force microscopy. The films were found to preserve their crystal structure at temperatures as high as 1100 °C for 5 min or annealing at 900 °C for 10 min in vacuum ambient (<1 mBar). Prolonged annealing at these temperatures led to partial transformation to β-phase Ga2O3 and possible amorphization of the films.

1 January 2023 in Batteries
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Journal Article
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MKMartin Kemény
Martin Kemény
POPeter Ondrejka
Peter Ondrejka
Miroslav MikolášekMiroslav Mikolášek
Miroslav Mikolášek
Lithium-ion (Li-ion) batteries with Ni-based cathodes are leading storage technology in the fields of electric vehicles and power-grid applications. NCA (LiNiCoAlO2) batteries are known for their troublesome degradation tendencies, and this susceptibility to degradation raises questions regarding the safety of their usage. Hence, it is of vital importance to analyse the degradation of NCA batteries via methods which are applicable to onboard systems, so that the changes in the battery’s state of health can be addressed accordingly. For this purpose, it is crucial to study batteries stressed by various conditions which might induce degradation of different origins or magnitudes. Methods such as electrochemical impedance spectroscopy (EIS), galvanostatic intermittent titration technique (GITT), and incremental capacity analysis (ICA) have been used in battery research for years, however, there is a lack of published studies which would analyse the degradation of NCA batteries by simultaneous usage of these methods, which is essential for a comprehensive and confirmatory understanding of battery degradation. This study intends to fill this research gap by analysing the degradation of NCA batteries via simultaneous usage of EIS, GITT, and ICA methods for common stress-inducing operating conditions (over-charge, over-discharge, and high-current charging).