This paper analyses the three-dimensional (3-D) surface texture of Co/CP/X (X = Cu, Ti, SM and Ni, CP: carbonaceous paste) nanoflakes prepared electrochemically using a conventional three electrode system.
We investigated the multifaceted gas sensing properties of porous silicon thin films electrodeposited onto (100) oriented P-type silicon wafers substrates. Our investigation delves into morphological, optical properties, and sensing capabilities, aiming to optimize their use as efficient gas sensors. Morphological analysis revealed the development of unique surfaces with distinct characteristics compared to untreated sample, yielding substantially rougher yet flat surfaces, corroborated by Minkowski Functionals analysis. Fractal mathematics exploration emphasized that despite increased roughness, HF/ethanol-treated surfaces exhibit flatter attributes compared to untreated Si sample. Optical approaches established a correlation between increased porosity and elevated localized states and defects, influencing the Urbach energy value. This contributed to a reduction in steepness values, attributed to heightened dislocations and structural disturbances, while the transconductance parameter decreases. Simultaneously, porosity enhances the strength of electron‒phonon interaction. The porous silicon thin films were further tested as effective gas sensors for CO2 and O2 vapors at room temperature, displaying notable changes in electrical resistance with varying concentrations. These findings bring a comprehensive exploration of some important characteristics of porous silicon surfaces and established their potential for advanced industrial applications.
12 May 2016 in Journal of Materials Science: Materials in Electronics
ZnO thin films of different thicknesses were prepared by thermal evaporation on glass substrates at room temperature. Deposition process was carried out in a vapour pressure of about 5.54 × 10 − 5 mbar. The substrate–target distance was kept constant during the process. By XRD and AFM techniques the microstructural characteristics and their changes with variation in thickness were studied. Electrical resistivity and conductivity of samples vs. temperature were investigated by four-probe method. It was shown that an increase in thickness causes a decrease in activation energy.
In this study, we investigated the morphology of synthesized Cu/Ni nanoparticles in trace of carbon sources by the co-deposition process of RF sputtering and RF-PECVD methods and localized surface plasmon resonance of CO gas sensing of Cu/Ni nanoparticles. The surface morphology was studied by analyzing 3D micrographs of atomic force microscopy using image processing techniques and fractal/multifractal analyses. The MountainsMap® Premium software with the two-way ANOVA (Variance analysis) and least-significant differences tests were used for statistical analysis. The surface nano-patterns have a local and global particular distribution. Experimental and simulated Rutherford backscattering spectra confirm the quality of nanoparticles. Then, prepared samples were exposed to CO gas flue to study their gas sensor application using the localized surface plasmon resonance method. Increasing the Ni layer over Cu one shows an interesting result in both morphology and gas sensing sides. Advanced stereometric analyses for the surface topography of thin films in conjunction with Rutherford backscattering spectrometry and Spectroscopic analysis make a unique study in the field.
We explored the morphological and 3D spatial properties of Cu/Ni thin films obtained by a co-deposition process. The 3D AFM topographic maps analysis indicated that the films displayed different morphologies and rough profiles dictated by their singular directional inhomogeneities. Moreover, Minkowski’s volume showed that the Cu/Ni films deposited after 15 and 20 min had a similar relative distribution of matter as a function of height, which is different from the individual Cu films. The Minkowski boundary and connectivity point out that the percolative properties of the Cu/Ni samples were similar to each other. However, they were distinct from the percolative features of the Cu sample. It was also observed that the surface microtexture of the films showed similar spatial complexity, dominant spatial frequencies, and topographical uniformity. For the Cu/Ni thin films, the Minkowski functionals morphological analysis showed that the type of film dictated the surface percolation. In contrast, clear fingerprints of multifractal behavior in all the samples were also observed, indicating that the multifractality degree increased with the sputtering time, supporting the significant vertical growth of the Cu/Ni thin film deposited after 20 min. Aside from that, the results from a symmetry-based approach indicated that the vertical growth dynamics of individual Cu and Cu/Ni thin films were different in terms of scaling symmetry, where we observed that the sputtering induced the formation of less asymmetric topographies regarding their multiscaling behavior. Finally, our findings suggested that the sputtering process can be employed to tune the percolative properties, multifractality, and scaling symmetry of the films, inducing different vertical growth dynamics, which can be useful in the optimization of the fabrication of bimetallic surfaces for technological purposes.