Henrique Duarte da Fonseca Filho

Prof. Dr. Henrique Duarte da Fonseca Filho

Laboratory of Synthesis of Nanomaterials and Nanoscopy, Physics Department, Federal University of Amazonas-UFAM, Manaus 69067-005, AM, Brazil
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Research Focus & Metrics

Academic Career Length

11Years (2016-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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10 July 2020 in Microscopy Research and Technique
Verified
Journal Article
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Robert MatosRobert Matos
Robert Matos
Erveton Pinheiro PintoErveton Pinheiro Pinto
Erveton Pinheiro Pinto
GRGlenda Quaresma Ramos
Glenda Quaresma Ramos
MAMarta Duarte da Fonseca de Albuquerque
Marta Duarte da Fonseca de Albuquerque
Henrique Duarte da Fonseca FilhoHenrique Duarte da Fonseca Filho
Henrique Duarte da Fonseca Filho

14 February 2024 in Scientific Reports
Verified
Journal Article
Open access
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AGAtefeh Ghaderi
Atefeh Ghaderi
JSJamshid Sabbaghzadeh
Jamshid Sabbaghzadeh
LDLaya Dejam
Laya Dejam
Ghobad Behzadi pourGhobad Behzadi pour
Ghobad Behzadi pour
EMEmad Moghimi
Emad Moghimi
SSShahram Solaymani
Shahram Solaymani
We investigated the multifaceted gas sensing properties of porous silicon thin films electrodeposited onto (100) oriented P-type silicon wafers substrates. Our investigation delves into morphological, optical properties, and sensing capabilities, aiming to optimize their use as efficient gas sensors. Morphological analysis revealed the development of unique surfaces with distinct characteristics compared to untreated sample, yielding substantially rougher yet flat surfaces, corroborated by Minkowski Functionals analysis. Fractal mathematics exploration emphasized that despite increased roughness, HF/ethanol-treated surfaces exhibit flatter attributes compared to untreated Si sample. Optical approaches established a correlation between increased porosity and elevated localized states and defects, influencing the Urbach energy value. This contributed to a reduction in steepness values, attributed to heightened dislocations and structural disturbances, while the transconductance parameter decreases. Simultaneously, porosity enhances the strength of electron‒phonon interaction. The porous silicon thin films were further tested as effective gas sensors for CO2 and O2 vapors at room temperature, displaying notable changes in electrical resistance with varying concentrations. These findings bring a comprehensive exploration of some important characteristics of porous silicon surfaces and established their potential for advanced industrial applications.

1 September 2021 in Surface and Coatings Technology
Verified
Journal Article
Closed access
ADAbhijeet Das
Abhijeet Das
VCVipin Chawla
Vipin Chawla
Robert MatosRobert Matos
Robert Matos
Henrique Duarte da Fonseca FilhoHenrique Duarte da Fonseca Filho
Henrique Duarte da Fonseca Filho
RYRam Pratap Yadav
Ram Pratap Yadav
SKSanjeev Kumar
Sanjeev Kumar

1 October 2020 in Micron
Verified
Journal Article
Closed access
Robert MatosRobert Matos
Robert Matos
GRGlenda Q. Ramos
Glenda Q. Ramos
Henrique Duarte da Fonseca FilhoHenrique Duarte da Fonseca Filho
Henrique Duarte da Fonseca Filho
Ștefan ȚăluȘtefan Țălu
Ștefan Țălu

1 March 2021 in Micron
Verified
Journal Article
Closed access
Robert MatosRobert Matos
Robert Matos
BPBianca S. Pinheiro
Bianca S. Pinheiro
ISIzabella S. Souza
Izabella S. Souza
RCRuy R. Paes de Castro
Ruy R. Paes de Castro
GRGlenda Q. Ramos
Glenda Q. Ramos
Henrique Duarte da Fonseca FilhoHenrique Duarte da Fonseca Filho
Henrique Duarte da Fonseca Filho

14 July 2022 in Scientific Reports
Verified
Journal Article
Open access
PDF file
AGAtefeh Ghaderi
Atefeh Ghaderi
ASAzizollah Shafiekhani
Azizollah Shafiekhani
SSShahram Solaymani
Shahram Solaymani
Ștefan ȚăluȘtefan Țălu
Ștefan Țălu
Henrique Duarte da Fonseca FilhoHenrique Duarte da Fonseca Filho
Henrique Duarte da Fonseca Filho
LDLaya Dejam
Laya Dejam
In this study, we investigated the morphology of synthesized Cu/Ni nanoparticles in trace of carbon sources by the co-deposition process of RF sputtering and RF-PECVD methods and localized surface plasmon resonance of CO gas sensing of Cu/Ni nanoparticles. The surface morphology was studied by analyzing 3D micrographs of atomic force microscopy using image processing techniques and fractal/multifractal analyses. The MountainsMap® Premium software with the two-way ANOVA (Variance analysis) and least-significant differences tests were used for statistical analysis. The surface nano-patterns have a local and global particular distribution. Experimental and simulated Rutherford backscattering spectra confirm the quality of nanoparticles. Then, prepared samples were exposed to CO gas flue to study their gas sensor application using the localized surface plasmon resonance method. Increasing the Ni layer over Cu one shows an interesting result in both morphology and gas sensing sides. Advanced stereometric analyses for the surface topography of thin films in conjunction with Rutherford backscattering spectrometry and Spectroscopic analysis make a unique study in the field.