Wojciech Koczorowski

Dr. Wojciech Koczorowski

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Research Focus & Metrics

Academic Career Length

30Years (1997-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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25 June 2020 in Applied Physics A
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Journal Article
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ENEwelina Nowak
Ewelina Nowak
Mirosław SzybowiczMirosław Szybowicz
Mirosław Szybowicz
ASAlicja Stachowiak
Alicja Stachowiak
WKWojciech Koczorowski
Wojciech Koczorowski
DSDetlev Schulz
Detlev Schulz
Szymon ŁośSzymon Łoś
Szymon Łoś
The presented article concerns the comparison between two different zinc-oxide structures - bulk crystals and polycrystalline thin films. Bulk crystals were grown by a Bridgman method. For thin-film production, a sol-gel spin-coated method was chosen. A part of thin layers samples was annealed in 600 $$^{o}$$ o C to induce recrystallization. The morphological and structural properties of all samples were investigated using various microscopy techniques, X-ray diffraction, and Raman spectroscopy. Confocal and scanning electron microscopy, as well as XRD, was used to estimate the influence of the recrystallization process on the morphology of the samples. The Raman vibrations in different scattering geometries were determined using polarized Raman spectra. What is more, in the case of the non-annealed sol-gel layer, the localized reorientation of crystallites was observed, using Raman microscopy. The morphology of the samples was compared to their optical properties, which were investigated by exploiting UV-Vis absorption and photoluminescence spectroscopy. Absorption spectroscopy allowed us to estimate the energy bandgap for different types of ZnO layers and to compare the values obtained for the ZnO crystal structure obtained by the Bridgman method. The photoluminescence and Raman spectroscopy were used to determine the possible defects correlated with the growth conditions.

1 March 2020 in Microporous and Mesoporous Materials
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Journal Article
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MSMariusz Sandomierski
Mariusz Sandomierski
ZBZuzanna Buchwald
Zuzanna Buchwald
WKWojciech Koczorowski
Wojciech Koczorowski
Adam VoelkelAdam Voelkel
Adam Voelkel

1 August 2017 in Materials Science in Semiconductor Processing
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Journal Article
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WKWojciech Koczorowski
Wojciech Koczorowski
PKPiotr Kuświk
Piotr Kuświk
MPMarta Przychodnia
Marta Przychodnia
KWK. Wiesner
K. Wiesner
SES. El-Ahmar
S. El-Ahmar
RCR. Czajka
R. Czajka

8 March 2021 in Materials
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ADAnna Dychalska
Anna Dychalska
WKWojciech Koczorowski
Wojciech Koczorowski
MTMarek Trzcinski
Marek Trzcinski
LMLidia Mosińska
Lidia Mosińska
Mirosław SzybowiczMirosław Szybowicz
Mirosław Szybowicz
Extensive Raman spectroscopy studies combined with scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) measurements were performed to investigate structural and chemical changes in diamond layers deposited by chemical vapour deposition (CVD) upon post-growth treatment with hydrogen. The aim of this study is to characterize the changes in micro-structural properties of diamond layers with different grain sizes and different contents of sp2 carbon phase. Hydrogenation or oxidization of diamond layer surface is often performed to modify its properties; however, it can also strongly affect the surface structure. In this study, the impact of hydrogenation on the structure of diamond layer surface and its chemical composition is investigated. Owing to their polycrystalline nature, the structural properties of CVD diamond layers can strongly differ within the same layer. Therefore, in this project, in order to compare the results before and after hydrogen treatment, the diamond layers are subjected to Raman spectroscopy studies in the vicinity of a T-shape marker fabricated on the surface of each diamond layer studied.

1 September 2019 in Sensors and Actuators A: Physical
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Journal Article
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SES. El-Ahmar
S. El-Ahmar
WKWojciech Koczorowski
Wojciech Koczorowski
APA.A. Poźniak
A.A. Poźniak
PKPiotr Kuświk
Piotr Kuświk
MPM. Przychodnia
M. Przychodnia
WSW. Strupiński
W. Strupiński

21 February 2014 in Journal of Applied Physics
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TGT. Grzela
T. Grzela
WKWojciech Koczorowski
Wojciech Koczorowski
GCG. Capellini
G. Capellini
RCR. Czajka
R. Czajka
MRM. W. Radny
M. W. Radny
TST. Schroeder
T. Schroeder
Cobalt germanide (CoxGey) is a candidate system for low resistance contact modules in future Ge devices in Si-based micro and nanoelectronics. In this paper, we present a detailed structural, morphological, and compositional study on CoxGey formation on Ge(001) at room temperature metal deposition and subsequent annealing. Scanning tunneling microscopy and low energy electron diffraction clearly demonstrate that room temperature deposition of approximately four monolayers of Co on Ge(001) results in the Volmer Weber growth mode, while subsequent thermal annealing leads to the formation of a Co-germanide continuous wetting layer which evolves gradually towards the growth of elongated CoxGey nanostructures. Two types of CoxGey nanostructures, namely, flattop- and ridge-type, were observed and a systematic study on their evolution as a function of temperature is presented. Additional transmission electron microscopy and x-ray photoemission spectroscopy measurements allowed us to monitor the reaction between Co and Ge in the formation process of the CoxGey continuous wetting layer as well as the CoxGey nanostructures.