We demonstrate an InGaN laser diode, in which the waveguiding quality of the device is improved by the introduction of highly doped (plasmonic) layer constituting an upper part of the GaN substrate. Thanks to this, we were able to suppress the electromagnetic mode leakage into the substrate without generating additional strain in the structure, in contrast to the typical design relying on thick AlGaN claddings. The plasmonic substrate is built as a stack of gallium nitride layers of various electron concentrations deposited by a combination of hydride epitaxy and high-pressure solution method. The mentioned improvements led to the reduction of the threshold current density of our devices down to $2\text{kA}/{\text{cm}}^2$ and to the optimization of the near and far field pattern.

Quantitative thermal measurements with spatial resolution allowing the examination of objects of submicron dimensions are still a challenging task. The quantity of methods providing spatial resolution better than 100 nm is very limited. One of them is scanning thermal microscopy (SThM). This method is a variant of atomic force microscopy which uses a probe equipped with a temperature sensor near the apex. Depending on the sensor current, either the temperature or the thermal conductivity distribution at the sample surface can be measured. However, like all microscopy methods, the SThM gives only qualitative information. Quantitative measuring methods using SThM equipment are still under development. In this paper, a method based on simultaneous registration of the static and the dynamic electrical resistances of the probe driven by the sum of dc and ac currents, and examples of its applications are described. Special attention is paid to the investigation of thin films deposited on thick substrates. The influence of substrate thermal properties on the measured signal and its dependence on thin film thermal conductivity and film thickness are analyzed. It is shown that in the case where layer thicknesses are comparable or smaller than the probe–sample contact diameter, a correction procedure is required to obtain actual thermal conductivity of the layer. Experimental results obtained for thin SiO\(_{\mathrm {2}}\) and BaTiO\(_{\mathrm {3 }}\)layers with thicknesses in the range from 11 nm to 100 nm are correctly confirmed with this approach.

This paper presents a study on sensing capabilities of stacks of nano-films deposited on a single-mode optical fiber's end face for application in label-free bio-recognition. The stack consist of five nano-films of periodically interchanging materials characterized by different refractive indices (n at λ = 1550 nm), aluminum Al _x O _y (n ~ 1.58 RIU) and titanium TiO _x (n ~ 2.42 RIU) oxides layers. The stack was deposited with the reactive magnetron sputtering technique. It has been found that the structures show sensitivity to refractive index of surrounding liquid (74.4 nm/RIU and 44.3 dBm/RIU) and negligible sensitivity to variations of temperature. Moreover, we show that these structures when functionalized can be used for selective detection of biological layer formation on their surface. In this study, a biotin-avidin complex was used to show a label-free bio-recognition capability of the approach. Avidin concentration of 1 mg/ml induced shift of the resonance wavelength and change in reflected power by 3 nm and 0.8 dBm, respectively, when BSA, which is nonspecific to biotin, resulted in a negligible change in spectral response. The approach seems to be very interesting, especially when such advantages as batch device fabrication, sensor robustness, and fully automatized stack deposition process are taken into account.