Accurate modeling of photovoltaic (PV) performance requires the precise calculation of module temperature. Currently, most temperature models rely on steady-state assumptions that do not account for the transient climatic conditions and thermal mass of the module. On the other hand, complex physics-based transient models are computationally expensive and difficult to parameterize. In order to address this, a new approach to transient thermal modeling was developed, in which the steady-state predictions from previous timesteps are weighted and averaged to accurately predict the module temperature at finer time scales. This model is informed by 3-D finite-element analyses, which are used to calculate the effect of wind speed and module unit mass on module temperature. The model, in application, serves as an added filter over existing steady-state models that smooths out erroneous values that are a result of intermittency in solar resource. Validation of this moving-average model has shown that it can improve the overall PV energy performance model accuracy by as much as 0.58% over steady-state models based on mean absolute error improvements and can significantly reduce the variability between the model predictions and measured temperature times series data.

An indoor soil deposition method has been developed to simulate natural soil deposition on glass coupons or one-cell and multicell photovoltaic (PV) modules. This method uses variable ambient humidity, coupon/module temperature, and dust composition within a single custom-made chamber to create a natural and uniform soil deposition layer. Antisoiling (AS) coatings from two different manufacturers were applied on two one-cell monocrystalline silicon modules. Three layers of Arizona road dust have been deposited on the one-cell modules with AS coatings and an uncoated one-cell reference module at varied humidity levels. The soiled modules were exposed to an open-circuit subsonic wind tunnel at varying speeds and the effectiveness of AS coatings have been quantified using the transmittance gain. Transmittance loss resulting from the AS coating has been measured and compared with the transmittance of the uncoated reference module using a reflectance spectrophotometer. Reflectance measurements have also been taken to compare the transmittance loss of Arizona road dust and soil collected from PV modules’ superstrates. The soiled one-cell modules were then exposed to rain from a rain simulator. The transmittance gain due to rain exposure is quantified using a rain gain and rain coefficient. These tests cumulatively may be used to help develop a test standard for evaluating the effectiveness of AS coatings.

Potential-induced degradation (PID) presents a critical reliability issue for solar photovoltaic (PV) modules, with three primary types identified in the literature, namely, PID_s (shunting type), PID_p (polarization type), and PID_c (corrosion type). Electrochemical/electrical impedance spectroscopy (EIS) is a highly effective but underutilized technique for differentiating between these PID mechanisms. When used alongside conventional I–V measurements (e.g., I_sc, V_oc, and FF), EIS offers direct insights into parameters such as R_s, R_p, and C_p, making it a valuable tool for PID type differentiation. In this study, two four-cell glass–glass modules were investigated using p-base PERC monofacial cells with EVA and POE encapsulants. Results indicate that V_oc and FF remained nearly unchanged under +1000 V stress for both EVA and POE modules, suggesting a minimal impact of PID stress on these parameters. However, I_sc was reduced by approximately 8.5% in the EVA module and 10% in the POE module. For the POE module, surface recombination (PID_p) is likely responsible for the I_sc loss, as R_s, R_p, and C_p showed no significant variation. Conversely, in the EVA module, the combined effects of surface recombination and junction recombination (PID_jr) are the probable cause of the I_sc loss, as evidenced by remarkable changes in R_p and C_p. The observed decrease in R_p for the EVA module is attributed to reduced dynamic diode resistance rather than ohmic shunt resistance. This reduction is linked to recombination currents induced by junction trap centers, formed by the positive voltage PID stress in the encapsulant, which contains trace amounts of oxidizable species such as CH₃COOH and/or H₂O. The objective of this study is to evaluate the impact of PID stress on the electrical characteristics of glass–glass PV modules with different encapsulants, utilizing a combined EIS and I–V approach to distinguish between PID mechanisms. The findings highlight the critical role of the encapsulant type in determining PID susceptibility, with the EVA module exhibiting significant degradation linked to junction recombination losses. These insights underscore the necessity of optimizing encapsulant materials to enhance PV module durability and reliability in real-world applications.

The operating temperatures of photovoltaic (PV) modules can be impacted by the selection of specific packaging materials, e.g., backsheets and encapsulants. This research focuses on the evaluation of operating temperature reduction of one-cell modules by comparing conventional Tedlar/polyester/Tedlar (TPT) backsheet with novel thermally conductive backsheets (TCBs) materials. A large number of one-cell modules with two TCB types (TCB_A and TCB_B) and baseline TPT type were fabricated and installed in three different climatic conditions of the hot-dry desert in Arizona (high and low wind speed locations) and North Carolina (temperate with low wind speed location). In this study, these two TCBs were compared with conventional TPT backsheet in terms of performance, lifetime and levelized cost of energy (LCOE). The field results were analyzed for thermal performance of TCBs compared to TPT at three sites for two and half years. This study concludes that the thermal and electrical performances of the PV modules can be improved by using TCB_A in hot and dry climate sites and TCB_B at temperate climate sites. Therefore, the lifetime of TCB-based modules is expected to be higher than TPT-based modules. Using backsheet-specific power degradation levels and assuming the same cost for both types of backsheets, the LCOE of modules using TCBs is estimated to be lower than that of TPT.

Hotspots pose a significant long-term reliability challenge in photovoltaic (PV) modules that can have a detrimental impact on the efficiency, safety, and financial viability of a PV system. This paper aims to evaluate the endurance of hotspot stress in pristine and prestressed glass–glass (GG) modules. The accelerated prestressing was conducted for 600 thermal cycles (TC600) to represent decades of field exposure. GG modules are quickly becoming an alternative to the traditional glass–backsheet (GB) modules that have been the industry standard. Unlike other conventional studies that subject only pristine modules to hotspot stress, this paper evaluates the performance of an accelerated/simulated field-aged GG module (using TC600) and a pristine GG module. Pre- and post-characterizations were performed before and after each test to determine changes in electrical performance and observe any defects in GG modules. During the hotspot test, an approximately 200 °C maximum cell temperature was observed with a cell shading of 25% (the worst-case shading ratio). After the hotspot test, electroluminescence imaging indicated that most cells in the prestressed GG module exhibited severe damage whereas no significant defects were evident in the pristine GG module where the prestressed GG module degraded 8.2% and the pristine GG module degraded 1.5% in maximum power. These findings are critical for the industry, considering that GG bifacial modules will dominate the market.