In dye decolorization tests a non-thermal plasma (NTP) corona discharge generated by a high voltage pin-to-ground plate displayed 82% color removal within 11 min. Total color removal was accomplished after 28 min. Different salts such as KCl, NaCl, CaCl₂ and AlCl₃ were utilized to check the influence of conductivity changes on the dye decolorization process. Higher dye solution conductivity improved the color removal efficiency. The discharge energy and degradation efficiency were computed for diverse concentrations for NaCl, KCl, CaCl₂ and AlCl₃, whereby it was noticed that the salts generally have a small impact on the level of dye decolorization using corona discharge. In addition, the essential reactive species involved in the oxidation of organic dye compounds such as ozone (O₃) generated in treated water and hydrogen peroxide (H₂O₂) were investigated and the energetic species that produced the non-thermal plasma at the optimum operation time were determined. Energy yields for decolorization and Electrical Energy per Order (EE/O) were calculated for different concentrations of NaCl, KCl, CaCl₂ and AlCl₃. This work may help in designing plasma systems appropriate for treatment of industrial wastewaters polluted by dyes.

Dye solution temperature influences the elimination efficiency of water-soluble and anionic acid dye. Acid Blue 25 dye, using a gas–liquid electrical discharge system, was successfully investigated. The results showed an increase in the percentage of dye decolorization from 91.16% to 96.12% when the dye solution temperature was increased from 278 K to 308 K. However, the initial dye decolorization percentage was decreased with the further increase in dye solution temperature from 318 K to 358 K. The 2D simulation model was introduced to consider the influence of temperature and the electric field generated by corona discharge plasma in air and water. Results also showed a great match between the experimental and the simulation results. The reaction rates of dye degradation were analyzed using the Arrhenius equation. Furthermore, pseudo-zero-, pseudo-first-, and pseudo-second-order models were used to determine the reaction kinetics. The best fit for the experimental data would follow the pseudo-first-order model. Finally, electrical energy per order, energy yield, and experimental degradation data were calculated to investigate the cost analysis.

Potential-induced degradation (PID) presents a critical reliability issue for solar photovoltaic (PV) modules, with three primary types identified in the literature, namely, PID_s (shunting type), PID_p (polarization type), and PID_c (corrosion type). Electrochemical/electrical impedance spectroscopy (EIS) is a highly effective but underutilized technique for differentiating between these PID mechanisms. When used alongside conventional I–V measurements (e.g., I_sc, V_oc, and FF), EIS offers direct insights into parameters such as R_s, R_p, and C_p, making it a valuable tool for PID type differentiation. In this study, two four-cell glass–glass modules were investigated using p-base PERC monofacial cells with EVA and POE encapsulants. Results indicate that V_oc and FF remained nearly unchanged under +1000 V stress for both EVA and POE modules, suggesting a minimal impact of PID stress on these parameters. However, I_sc was reduced by approximately 8.5% in the EVA module and 10% in the POE module. For the POE module, surface recombination (PID_p) is likely responsible for the I_sc loss, as R_s, R_p, and C_p showed no significant variation. Conversely, in the EVA module, the combined effects of surface recombination and junction recombination (PID_jr) are the probable cause of the I_sc loss, as evidenced by remarkable changes in R_p and C_p. The observed decrease in R_p for the EVA module is attributed to reduced dynamic diode resistance rather than ohmic shunt resistance. This reduction is linked to recombination currents induced by junction trap centers, formed by the positive voltage PID stress in the encapsulant, which contains trace amounts of oxidizable species such as CH₃COOH and/or H₂O. The objective of this study is to evaluate the impact of PID stress on the electrical characteristics of glass–glass PV modules with different encapsulants, utilizing a combined EIS and I–V approach to distinguish between PID mechanisms. The findings highlight the critical role of the encapsulant type in determining PID susceptibility, with the EVA module exhibiting significant degradation linked to junction recombination losses. These insights underscore the necessity of optimizing encapsulant materials to enhance PV module durability and reliability in real-world applications.