Massimo Camarda

Dr. Massimo Camarda

orcid

Research Focus & Metrics

Academic Career Length

24Years (2003-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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31 December 2021 in Cancers
Verified
Journal Article
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Giorgio Ivan RussoGiorgio Ivan Russo
Giorgio Ivan Russo
Nicolò MussoNicolò Musso
Nicolò Musso
ARAlessandra Romano
Alessandra Romano
Giuseppe CarusoGiuseppe Caruso
Giuseppe Caruso
SPSalvatore Petralia
Salvatore Petralia
Massimo CamardaMassimo Camarda
Massimo Camarda
Liquid biopsy is emerging as a potential diagnostic tool for prostate cancer (PC) prognosis and diagnosis. Unfortunately, most circulating tumor cells (CTC) technologies, such as AdnaTest or Cellsearch®, critically rely on the epithelial cell adhesion molecule (EpCAM) marker, limiting the possibility of detecting cancer stem-like cells (CSCs) and mesenchymal-like cells (EMT-CTCs) that are present during PC progression. In this context, dielectrophoresis (DEP) is an epCAM independent, label-free enrichment system that separates rare cells simply on the basis of their specific electrical properties. As compared to other technologies, DEP may represent a superior technique in terms of running costs, cell yield and specificity. However, because of its higher complexity, it still requires further technical as well as clinical development. DEP can be improved by the use of microfluid, nanostructured materials and fluoro-imaging to increase its potential applications. In the context of cancer, the usefulness of DEP lies in its capacity to detect CTCs in the bloodstream in their epithelial, mesenchymal, or epithelial–mesenchymal phenotype forms, which should be taken into account when choosing CTC enrichment and analysis methods for PC prognosis and diagnosis.

15 July 2018 in Sensors
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Journal Article
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Salvatore TudiscoSalvatore Tudisco
Salvatore Tudisco
Francesco La ViaFrancesco La Via
Francesco La Via
Clementina AgodiClementina Agodi
Clementina Agodi
CACarmen Altana
Carmen Altana
GBGiacomo Borghi
Giacomo Borghi
AZAnd M. Zimbone
And M. Zimbone
Silicon carbide (SiC) is a compound semiconductor, which is considered as a possible alternative to silicon for particles and photons detection. Its characteristics make it very promising for the next generation of nuclear and particle physics experiments at high beam luminosity. Silicon Carbide detectors for Intense Luminosity Investigations and Applications (SiCILIA) is a project starting as a collaboration between the Italian National Institute of Nuclear Physics (INFN) and IMM-CNR, aiming at the realization of innovative detection systems based on SiC. In this paper, we discuss the main features of silicon carbide as a material and its potential application in the field of particles and photons detectors, the project structure and the strategies used for the prototype realization, and the first results concerning prototype production and their performance.

1 January 2010 in Thin Solid Films
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Journal Article
Closed access
ASA. Severino
A. Severino
CBC. Bongiorno
C. Bongiorno
NPN. Piluso
N. Piluso
MIM. Italia
M. Italia
Massimo CamardaMassimo Camarda
Massimo Camarda
Francesco La ViaFrancesco La Via
Francesco La Via

15 April 2011 in Journal of Microelectromechanical Systems
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Journal Article
Closed access
RAR. Anzalone
R. Anzalone
GDGiuseppe D'Arrigo
Giuseppe D'Arrigo
Massimo CamardaMassimo Camarda
Massimo Camarda
CLC. Locke
C. Locke
SSS. E. Saddow
S. E. Saddow
Francesco La ViaFrancesco La Via
Francesco La Via
SiC is a candidate material for microelectromechanical and nanoelectromechanical systems, but the high residual stress created during the film grow limits the development of the material for these applications. To understand the stress relaxation mechanism in hetero-epitaxial 3C-SiC films, different micromachined free-standing structures have been realized. In this paper, assisted by finite-element method (FEM), a micromachined planar rotating probe was developed for residual stress analysis to split the stress into the following two components: 1) the gradient residual stress (σ 1 ) related to the film defects and 2) the uniform stress (σ 0 ) related to the substrate. Transmission electron microscopy characterization studies about the defect formation and the defect evolution as a function of thickness on 3C-SiC on the Si substrate revealed the problems due to the incorrect linear stress approximation in a heteroepitaxial thin film. With FEM, an exponential approximation of the stress relationship was studied, yielding a better fit with the experimental data. This paper shows that the new approximation of the total residual stress function reduces the actual disagreement between experimental and simulation data.

1 December 2007 in Journal of Computational Physics
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Journal Article
Closed access
Massimo CamardaMassimo Camarda
Massimo Camarda
AMAntonino La Magna
Antonino La Magna
Francesco La ViaFrancesco La Via
Francesco La Via

25 February 2023 in Applied Sciences
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Journal Article
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FRFrancesco Romano
Francesco Romano
GMGiuliana Milluzzo
Giuliana Milluzzo
FMfabio di martino
fabio di martino
MDMaria Cristina D'Oca
Maria Cristina D'Oca
GFGiuseppe Felici
Giuseppe Felici
Massimo CamardaMassimo Camarda
Massimo Camarda
Ultra-high dose rate (UHDR) beams for FLASH radiotherapy present significant dosimetric challenges. Although novel approaches for decreasing or correcting ion recombination in ionization chambers are being proposed, applicability of ionimetric dosimetry to UHDR beams is still under investigation. Solid-state sensors have been recently investigated as a valuable alternative for real-time measurements, especially for relative dosimetry and beam monitoring. Among them, Silicon Carbide (SiC) represents a very promising candidate, compromising between the maturity of Silicon and the robustness of diamond. Its features allow for large area sensors and high electric fields, required to avoid ion recombination in UHDR beams. In this study, we present simulations and experimental measurements with the low energy UHDR electron beams accelerated with the ElectronFLASH machine developed by the SIT Sordina company (IT). The response of a newly developed 1 × 1 cm2 SiC sensor in charge as a function of the dose-per-pulse and its radiation hardness up to a total delivered dose of 90 kGy, was investigated during a dedicated experimental campaign, which is, to our knowledge, the first characterization ever done of SiC with UHDR-pulsed beams accelerated by a dedicated ElectronFLASH LINAC. Results are encouraging and show a linear response of the SiC detector up to 2 Gy/pulse and a variation in the charge per pulse measured for a cumulative delivered dose of 90 kGy, within ±0.75%.