Tukun Li

Dr. Tukun Li

orcid

Research Focus & Metrics

Academic Career Length

19Years (2008-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 January 2015 in Procedia CIRP
Verified
Journal Article
Open access
QQQunfen Qi
Qunfen Qi
TLTukun Li
Tukun Li
PSPaul Scott
Paul Scott
XJXiangqian Jiang
Xiangqian Jiang
A number of areal surface texture parameters have been adopted by standards bodies, namely ISO 25178-2, in which forty-one parameters within six groups are defined. The selection of the suitable areal parameters becomes an issue for a designer. The study of correlation among parameters is one of the ways to find the most suitable parameters for a specification. This paper presents a Spearman's correlation study of areal surface texture parameters on some typical machined surfaces. Sixty surfaces, produced by nineteen machining methods, have been assessed by the use of an optical instrument; the operators adhered to ISO 25178-3; and parameters defined by ISO 25178-2. The correlation results are classified by using five correlation levels. It details the correlations between different groups of parameters, together with the correlation of parameters within the same group. The results are presented in Spearman's rank correlation coefficient matrix and charts. A three-layer parameters tree is then proposed to help engineer in the selection of parameters

17 March 2023 in Measurement
Verified
Journal Article
Closed access
FLFan Liu
Fan Liu
Yanlong CaoYanlong Cao
Yanlong Cao
TLTukun Li
Tukun Li
LRLifei Ren
Lifei Ren
JZJunnan Zhi
Junnan Zhi
XJXiangqian Jiang
Xiangqian Jiang

20 February 2024 in CIRP Journal of Manufacturing Science and Technology
Verified
Journal Article
Closed access
YXYuanping Xu
Yuanping Xu
CZChaolong Zhang
Chaolong Zhang
ZXZhijie Xu
Zhijie Xu
CKChao Kong
Chao Kong
DTDan Tang
Dan Tang
JJJin Jin
Jin Jin

10 October 2016 in The International Journal of Advanced Manufacturing Technology
Verified
Journal Article
Open access
PDF file
YQYuchu Qin
Yuchu Qin
WLWenlong Lu
Wenlong Lu
QQQunfen Qi
Qunfen Qi
TLTukun Li
Tukun Li
MHMeifa Huang
Meifa Huang
XJXiangqian Jiang
Xiangqian Jiang
Representing the semantics of the interaction of two or more tolerances (i.e., composite tolerance) explicitly to make them computer-understandable is currently a challenging task in computer-aided tolerancing (CAT). We have proposed a description logic (DL) ontology-based approach to complete this task recently. In this paper, the representation of the semantics of the composite positional tolerance (CPT) for patterns of holes (POHs) is used as an example to illustrate the proposed approach. This representation mainly includes representing the structure knowledge of the CPT for POHs in DL terminological axioms; expressing the constraint knowledge with Horn rules; and describing the individual knowledge using DL assertional axioms. By implementing the representation with the web ontology language (OWL) and the semantic web rule language (SWRL), a CPT ontology is developed. This ontology has explicitly computer-understandable semantics due to the logic-based semantics of OWL and SWRL. As is illustrated by an engineering example, such semantics makes it possible to automatically check the consistency, reason out the new knowledge, and implement the semantic interoperability of CPT information. Benefiting from this, the ontology provides a semantic enrichment model for the CPT information extracted from CAD/CAM systems.

13 February 2025 in Nanomaterials
Verified
Journal Article
Open access
PDF file
LMLing MA
Ling MA
XXXipeng Xu
Xipeng Xu
CCChangcai Cui
Changcai Cui
TLTukun Li
Tukun Li
SLShan Lou
Shan Lou
WZWenhan Zeng
Wenhan Zeng
This article aims to complete a review of current literature describing the measurement and characterization of photoelectric and geometric properties of perovskite solar cell (PSC) film layer materials using the spectroscopic ellipsometry (SE) measurement technique. Firstly, the influence of film quality on the performance of PSCs is combed and analyzed. Secondly, SE measurement technology is systematically introduced, including the measurement principle and data analysis. Thirdly, a detailed summary is provided regarding the characterization of the geometric and optoelectronic properties of the substrate, electron transport layer (ETL), perovskite layer, hole transport layer (HTL), and metal electrode layer using SE. The oscillator models commonly used in fitting film layer materials in PSCs are comprehensively summarized. Fourthly, the application of SE combined with various measurement techniques to assess the properties of film layer materials in PSCs is presented. Finally, the noteworthy direction of SE measurement technology in the development of PSCs is discussed. The review serves as a valuable reference for further enhancing the application of SE in PSCs, ultimately contributing to the commercialization of PSCs.

1 January 2013 in Procedia CIRP
Verified
Journal Article
Open access
CCChangcai Cui
Changcai Cui
TLTukun Li
Tukun Li
LBL.A. Blunt
L.A. Blunt
XJXiangqian Jiang
Xiangqian Jiang
HHH. Huang
H. Huang
WFW. Fan
W. Fan
The straightness and flatness errors are generally assessed by using the Least Squares Method (LSM). However, the results obtained from LSM often overestimate the tolerances, and are not consistent with the ISO standards’ definitions. To this end, this paper presents a method to evaluate those errors by using particle swarm optimization (PSO). The realization technique is detailed. The experimental data is utilized to verify this algorithm, together with a comparison with some typical optimization algorithms