Ronald F.  DeMara

Dr. Ronald F. DeMara

Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL, USA

Research Focus & Metrics

Academic Career Length

36Years (1991-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 June 2015 in Microelectronics Journal
Verified
Journal Article
Closed access
Arman RoohiArman Roohi
Arman Roohi
RDRonald F. DeMara
Ronald F. DeMara
NKNavid Khoshavi
Navid Khoshavi

1 March 2017 in Microprocessors and Microsystems
Verified
Journal Article
Closed access
ACAmir Mokhtar Chabi
Amir Mokhtar Chabi
ARArman Roohi
Arman Roohi
HKHossein Khademolhosseini
Hossein Khademolhosseini
SSShadi Sheikhfaal
Shadi Sheikhfaal
Shaahin AngiziShaahin Angizi
Shaahin Angizi
RDRonald F. DeMara
Ronald F. DeMara

1 August 2004 in Integration
Verified
Journal Article
Closed access
SSS.C. Smith
S.C. Smith
RDRonald F. DeMara
Ronald F. DeMara
JYJ.S. Yuan
J.S. Yuan
DFD Ferguson
D Ferguson
DLD. Lamb
D. Lamb

15 November 2015
Verified
Conference Paper
Open access
PDF file
RARizwan A. Ashraf
Rizwan A. Ashraf
RGRoberto Gioiosa
Roberto Gioiosa
GKGokcen Kestor
Gokcen Kestor
RDRonald F. DeMara
Ronald F. DeMara
CCChen-Yong Cher
Chen-Yong Cher
PBPradip Bose
Pradip Bose
Resiliency of exascale systems has quickly become an important concern for the scientific community. Despite its importance, still much remains to be determined regarding how faults disseminate or at what rate do they impact HPC applications. The understanding of where and how fast faults propagate could lead to more efficient implementation of application-driven error detection and recovery. In this work, we propose a fault propagation framework to analyze how faults propagate in MPI applications and to understand their vulnerability to faults. We employ a combination of compiler-level code transformation and instrumentation, along with a runtime checker. Using the information provided by our framework, we employ machine learning technique to derive application fault propagation models that can be used to estimate the number of corrupted memory locations at runtime.

21 July 2016 in IEEE Transactions on Emerging Topics in Computing
Verified
Journal Article
Closed access
Arman RoohiArman Roohi
Arman Roohi
Ramin ZandRamin Zand
Ramin Zand
Shaahin AngiziShaahin Angizi
Shaahin Angizi
RDRonald F. DeMara
Ronald F. DeMara
A novel Parity-Preserving Reversible Gate (PPRG) is developed using Quantum-dot Cellular Automata (QCA) technology. PPRG enables rich fault-tolerance features, as well as reversibility attributes sought for energy-neutral computation. Performance of the PPRG design is validated through implementing thirteen standard combinational Boolean functions of three variables, which demonstrate from 10.7 to 41.9 percent improvement over the previous gate counts obtained with other reversible and/or preserving gate designs. Switching and leakage energy dissipation as low as 0.141 eV and 0.294 eV, for 1.5 Ek energy level are achieved using PPRG, respectively. The utility of PPRG is leveraged to design a one-bit full adder with 171 cells occupying only 0.19 mm 2 area. Finally, fault detection and isolation properties are formalized into a concise procedure. PPRG-based circuits capable of self-configuring active recovery for selected three-variable standard functions are realized using a memoryless method irrespective of garbage outputs.

26 March 2019 in ACM Journal on Emerging Technologies in Computing Systems
Verified
Journal Article
Open access
PDF file
Ramin ZandRamin Zand
Ramin Zand
KCKerem Y. Camsari
Kerem Y. Camsari
SDSupriyo Datta
Supriyo Datta
RDRonald F. DeMara
Ronald F. DeMara
Magnetoresistive random access memory (MRAM) technologies with thermally unstable nanomagnets are leveraged to develop an intrinsic stochastic neuron as a building block for restricted Boltzmann machines (RBMs) to form deep belief networks (DBNs). The embedded MRAM-based neuron is modeled using precise physics equations. The simulation results exhibit the desired sigmoidal relation between the input voltages and probability of the output state. A probabilistic inference network simulator (PIN-Sim) is developed to realize a circuit-level model of an RBM utilizing resistive crossbar arrays along with differential amplifiers to implement the positive and negative weight values. The PIN-Sim is composed of five main blocks to train a DBN, evaluate its accuracy, and measure its power consumption. The MNIST dataset is leveraged to investigate the energy and accuracy tradeoffs of seven distinct network topologies in SPICE using the 14nm HP-FinFET technology library with the nominal voltage of 0.8V, in which an MRAM-based neuron is used as the activation function. The software and hardware level simulations indicate that a 784× 200× 10 topology can achieve less than 5% error rates with ∼400pJ energy consumption. The error rates can be reduced to 2.5% by using a 784× 500× 500× 500× 10 DBN at the cost of ∼10× higher energy consumption and significant area overhead. Finally, the effects of specific hardware-level parameters on power dissipation and accuracy tradeoffs are identified via the developed PIN-Sim framework.