Single flux quantum (SFQ) digital logic has been proposed for the scalable control of next-generation superconducting-qubit arrays. In the initial implementation, SFQ-based gate fidelity was limited by quasiparticle (QP) poisoning induced by the dissipative on-chip SFQ driver circuit. In this work, we introduce a multichip-module architecture to suppress phonon-mediated QP poisoning. Here, the SFQ elements and qubits are fabricated on separate chips that are joined with -bump bonds. We use interleaved randomized benchmarking to characterize the fidelity of SFQ-based gates and we demonstrate an error per Clifford gate of 1.2(1)%, an order-of-magnitude reduction over the gate error achieved in the initial realization of SFQ-based qubit control. We use purity benchmarking to quantify the contribution of incoherent error at 0.96(2)%; we attribute this error to photon-mediated QP poisoning mediated by the resonant millimeter-wave antenna modes of the qubit and SFQ-qubit coupler. We anticipate that a straightforward redesign of the SFQ driver circuit to limit the bandwidth of the SFQ pulses will eliminate this source of infidelity, allowing SFQ-based gates with error approaching approximate known theoretical limits, of order 0.1% for resonant sequences and 0.01% for more complex pulse sequences involving variable pulse-to-pulse separation.
Scaling of quantum computers to fault-tolerant levels relies critically on the integration of energy-efficient, stable, and reproducible qubit control and readout electronics. In comparison to traditional semiconductor-control electronics (TSCE) located at room temperature, the signals generated by rf sources based on Josephson-junctions (JJs) benefit from small device sizes, low power dissipation, intrinsic calibration, superior reproducibility, and insensitivity to ambient fluctuations. Previous experiments to colocate qubits and JJ-based control electronics have resulted in quasiparticle poisoning of the qubit, degrading the coherence and lifetime of the qubit. In this paper, we digitally control a 0.01-K transmon qubit with pulses from a Josephson pulse generator (JPG) located at the 3-K stage of a dilution refrigerator. We directly compare the qubit lifetime , the coherence time , and the thermal occupation when the qubit is controlled by the JPG circuit versus the TSCE setup. We find agreement to within the daily fluctuations of and for and , respectively, and agreement to within the 1% error for . Additionally, we perform randomized benchmarking to measure an average JPG gate error of . In combination with a small device size () and low on-chip power dissipation (), these results are an important step toward demonstrating the viability of using JJ-based control electronics located at temperature stages higher than the mixing-chamber stage in highly scaled superconducting quantum information systems.
This paper presents a full characterization of a Dual Josephson Impedance Bridge (DJIB) at frequencies up to 80 kHz by using the DJIB to compare the best available impedance standards that are (a) directly traceable to the quantum Hall effect, (b) used as part of international impedance comparisons, or (c) believed to have calculable frequency dependence. The heart of the system is a dual Josephson Arbitrary Waveform Synthesizer (JAWS) source that offers unprecedented flexibility in high-precision impedance measurements. The JAWS sources allow a single bridge to compare impedances with arbitrary ratios and phase angles in the complex plane. The uncertainty budget shows that both the traditional METAS bridges and the DJIB have comparable uncertainties in the kilohertz range. This shows that the advantages of the DJIB, including the flexibility which allows the comparison of arbitrary impedances, the wide frequency range, and the automated balancing procedure, are obtained without compromising the measurement uncertainties. These results demonstrate that this type of instrument can considerably simplify the realization and maintenance of the various impedance scales. In addition, the DJIB is a very sensitive tool for investigating the frequency-dependent systematic-errors that can occur in impedance construction and in the voltage provided by the JAWS source at frequencies greater than 10 kHz.