Karlis Kundzins, M.Sc. Physics, is a researcher at the Thin
Films Laboratory, received MSc at University of Latvia in 1989. He has
extensive practical expertise in ferroelectric materials science and ferroelectric
material characterization techniques (e.g., I-V, AFM, XRD). He is primarily
responsible for microstructural characterization and oversees the operation of
SEM, FIB, EDX, and TEM facilities. He also has significant experience in thin-film development, optical and electron beam lithography, and ion beam
structuring technologies.
Karlis Kundzins, M.Sc. Physics, is a researcher at the Thin
Films Laboratory, received MSc at University of Latvia in 1989. He has
extensive practical expertise in ferroelectric materials science and ferroelectric
material characterization techniques (e.g., I-V, AFM, XRD). He is primarily
responsible for microstructural characterization and oversees the operation of
SEM, FIB, EDX, and TEM facilities. He also has significant experience in thin-film development, optical and electron beam lithography, and ion beam
structuring technologies.