This paper presents a novel electro-thermal modeling approach for a lithium-ion battery pack in an electric vehicle (EV), along with parameter identification using controller area network (CAN) data collected from chassis dynamometer and real-world driving tests. The proposed electro-thermal model consists of a first-order equivalent circuit model (ECM) and a lumped-parameter thermal network in considering a simplified cooling circuit layout and temperature distributions across four distinct zones within the battery pack. This model captures the nonuniform heat transfer between the pack modules and the coolant, as well as variations in coolant temperature and flow rates. Model parameters are identified directly from vehicle-level test data without relying on laboratory-level measurements. Validation results demonstrate that the model can predict terminal voltage with an RMSE of less than 6 V (normalized root mean square error of less than 2%), and battery module surface temperatures with root mean square errors of less than 2 °C for over 90% of the test cases. The proposed approach provides a cost-effective and accurate solution for predicting electro-thermal behavior of EV battery systems, making it a valuable tool for battery design and management to optimize performance and ensure the safety of EVs.

This work provides a systematic evaluation of the performance and regulated emissions of binary n-pentanol–diesel blends under steady-state conditions, thereby clarifying condition-dependent efficiency–emission trade-offs across multiple loads and speeds. A single-cylinder, air-cooled diesel engine was operated at two speeds (1700 and 2700 rpm) and four brake mean effective pressure (BMEP) levels (0.25–0.49 MPa) using commercial diesel (D100) and three n-pentanol–diesel blends at volume ratios of 10%, 30%, and 50% (designated D90P10, D70P30, and D50P50, respectively). Brake thermal efficiency (BTE), brake specific energy consumption (BSEC), and brake specific fuel consumption (BSFC) were measured alongside exhaust emissions of nitrogen oxides (NO_x), carbon monoxide (CO), hydrocarbon (HC), carbon dioxide (CO₂), and smoke opacity. The results show that due to a lower cetane number, high latent heat of vaporization, and reduced heating value, n-pentanol blends incur efficiency and fuel consumption penalties at light to moderate loads. However, these disadvantages diminish or reverse at high loads and speeds: D50P50 surpasses D100 in BTE and matches or improves BSEC and BSFC at 2700 rpm and 0.49 MPa. Emission data reveal that the blend’s fuel-bound oxygen and enhanced mixing provide up to 16% NO_x reduction; 35% and 45% reductions in CO and HC, respectively; and a 74% reduction in smoke opacity under demanding conditions, while CO₂ per unit work output aligns with or falls below D100 at high load. These findings demonstrate that optimized n-pentanol–diesel blends can simultaneously improve efficiency and mitigate emissions, offering a practical pathway for low-carbon diesel engines.

In order to implement more advanced nonvolatile memory device, many studies have been devoted to improve program/erase speed, endurance, and retention characteristics of nitride-based SONOS flash memory. As the CMOS device size shrinks down, the oxide-nitride-oxide (ONO) multi-layer where charge storage takes place in discrete traps in the silicon nitride layer needs the optimization of thickness and material properties in order for the SONOS flash device to follow the CMOS technology development trend. However, the retention characteristics of SONOS flash memory degrade with the scaling of tunnel oxide, although the program/erase speed is enhanced with the decrease of tunnel oxide thickness. To overcome this problem, we adopted the SONOS structures with bandgap-engineered tunnel oxide layer. The bandgap- engineered SONOS flash memory provides faster erase speed and better retention characteristics than the conventional SONOS flash memory in our previous work. In order to identify the limitation of the equivalent oxide thickness (EOT) of the ultra-thin ONO barrier which replaces the single tunnel oxide layer in the conventional SONOS structures, we have controlled the EOT of the ONO barrier by the standard CMOS process and investigated their effects on the program/erase speed, memory window, and data retention characteristics of the bandgap-engineered SONOS flash memory device. As a result, the experimental data show that the ONO has a degree of freedom in the thickness of each layer but the data retention loss should be still considered. The SONOS flash memory with bandgap engineering by adopting the ONO barrier instead of single tunnel oxide layer should have a lower limit of 3 nm as the EOT for both performance and reliability.