Uliana Prokhorova

Mrs. Uliana Prokhorova

orcid

Research Focus & Metrics

Academic Career Length

14Years (2013-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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7 August 2013 in Semiconductors
Verified
Journal Article
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APA. A. Pastor
A. A. Pastor
UPUliana Prokhorova
Uliana Prokhorova
PSP. Yu. Serdobintsev
P. Yu. Serdobintsev
VCVladimir Chaldyshev
Vladimir Chaldyshev
MYM. A. Yagovkina
M. A. Yagovkina
GaAs samples grown by molecular-beam epitaxy at low (230°C) temperatures are investigated. One of the samples is subjected to aftergrowth annealing at 600°C. Using an unconventional pump-probe scheme...

31 October 2015 in Quantum Electronics
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Journal Article
Closed access
MBM V Balabas
M V Balabas
EEE A Efremova
E A Efremova
AIA Yu Ivanov
A Yu Ivanov
AKA I Kantserov
A I Kantserov
IKI R Krylov
I R Krylov
ASA A Shimko
A A Shimko

15 October 2025 in Applied Sciences
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Journal Article
Open access
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VSVladimir Sementin
Vladimir Sementin
MGMikhail Gavrish
Mikhail Gavrish
PRPavel Rozanov
Pavel Rozanov
UPUliana Prokhorova
Uliana Prokhorova
APA. P. Pogoda
A. P. Pogoda
ABAnatoly Boreysho
Anatoly Boreysho
Non-contact, non-destructive testing of surface microgeometry plays a key role in such industries as microelectronics, additive manufacturing, and precision engineering. This paper presents the development and experimental testing of a digital holographic system based on a low-coherence laser diode operating at two close wavelengths, designed to measure height differences in the micrometer range. The method is based on a Michelson interferometer and reconstruction of the complex amplitude of the object wave, which allows phase measurements with subsequent phase conversion into heights. The tests were carried out on micrometer roughness standards with a trapezoidal profile with a groove depth from 24.5 μm to 100 μm and a profile width from 65 μm to 150 μm, as well as on reference strokes with a width from 25 to 200 μm. The obtained data demonstrate the possibility of three-dimensional and two-dimensional visualization of the objects under study with a relative error in height from 5.3% to 11.6% and in width up to 18.6%. It is shown that the system allows reliable measurement of defects of metal surfaces in the range from 25 to 100 μm both vertically and horizontally. Thus, the developed method can be used for high-precision, non-destructive testing in a wide range of technological tasks.

20 March 2026 in PHOTONICS Russia
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Journal Article
Closed access
ОУО.е. Удовиченко
О.е. Удовиченко
MGMikhail Gavrish
Mikhail Gavrish
СМС.с. Макарин
С.с. Макарин
ННН.в. Никоноров
Н.в. Никоноров
UPUliana Prokhorova
Uliana Prokhorova
АПА.п. Погода
А.п. Погода
В статье дан краткий обзор методов записи объемных голографических решеток Брэгга используемых в качестве оптических элементов для управления спектром излучения мощных импульсных твердотельных лазеров. Рассмотрены регистрирующие среды голографических решеток Брэгга (галогенидосеребряные эмульсии, слои хромированного желатина, кристалл ниобата лития (LiNbO3) и фототерморефрактивное стекло). Представлены схемы записи Ллойда, Майкельсона и Тальбота. Описаны требования, предъявляемые к пространственной стабильности лазерного излучения, и приведена методика их контроля. Приведены экспериментальные результаты процесса записи пропускающих решеток Брэгга в различных твердотельных материалах. Определен порог поверхностной лучевой стойкости фототерморефрактивного стекла путем регистрации пробоя поверхности решетки. Доказана возможность использования решетки в мощных импульсных лазерах.