Alexander Rogozhin

Dr. Alexander Rogozhin

orcid

Research Focus & Metrics

Academic Career Length

21Years (2006-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 April 2010 in International Journal of Production Economics
Verified
Journal Article
Closed access
ARAlexander Rogozhin
Alexander Rogozhin
MGMichael Gallaher
Michael Gallaher
GHGloria Helfand
Gloria Helfand
WMWalter McManus
Walter McManus

14 February 2018 in Journal of Materials Science
Verified
Journal Article
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YCYury Chesnokov
Yury Chesnokov
Andrey V. MiakonkikhAndrey V. Miakonkikh
Andrey V. Miakonkikh
ARAlexander Rogozhin
Alexander Rogozhin
Konstantin RudenkoKonstantin Rudenko
Konstantin Rudenko
AVAlexander Vasiliev
Alexander Vasiliev

21 January 2021 in Coatings
Verified
Journal Article
Open access
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ARAlexander Rogozhin
Alexander Rogozhin
Andrey V. MiakonkikhAndrey V. Miakonkikh
Andrey V. Miakonkikh
ESElizaveta Smirnova
Elizaveta Smirnova
ALAndrew A. Lomov
Andrew A. Lomov
SSSergey Simakin
Sergey Simakin
Konstantin RudenkoKonstantin Rudenko
Konstantin Rudenko
Ruthenium thin films were deposited by plasma-enhanced atomic layer deposition (PEALD) technology using Ru(EtCp)2 and oxygen plasma on the modified surface of silicon and SiO2/Si substrates. The crystal structure, chemical composition, and morphology of films were characterized by grazing incidence XRD (GXRD), secondary ion mass spectrometry (SIMS), and atomic force microscopy (AFM) techniques, respectively. It was found that the mechanism of film growth depends crucially on the substrate temperature. The GXRD and SIMS analysis show that at substrate temperature T = 375 °C, an abrupt change in surface reaction mechanisms occurs, leading to the changing in film composition from RuO2 at low temperatures to pure Ru film at higher temperatures. It was confirmed by electrical resistivity measurements for Ru-based films. Mechanical stress in the films was also analyzed, and it was suggested that this factor increases the surface roughness of growing Ru films. The lowest surface roughness ~1.5 nm was achieved with a film thickness of 29 nm using SiO2/Si-substrate for deposition at 375 °C. The measured resistivity of Ru film is 18–19 µOhm·cm (as deposited).

27 July 2018 in Biosensors
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Journal Article
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Kristina MalsagovaKristina Malsagova
Kristina Malsagova
TPTatyana Pleshakova
Tatyana Pleshakova
AKAndrey Kozlov
Andrey Kozlov
ISIvan D. Shumov
Ivan D. Shumov
I Mikhail Ilnitsky
Mikhail Ilnitsky
YIYuri D. Ivanov
Yuri D. Ivanov
Application of micro-Raman spectroscopy for the monitoring of quality of high-k (h-k) dielectric protective layer deposition onto the surface of a nanowire (NW) chip has been demonstrated. A NW chip based on silicon-on-insulator (SOI) structures, protected with a layer of high-k dielectric ((h-k)-SOI-NW chip), has been employed for highly sensitive detection of microRNA (miRNA) associated with oncological diseases. The protective dielectric included a 2-nm-thick Al2O3 surface layer and a 8-nm-thick HfO2 layer, deposited onto a silicon SOI-NW chip. Such a chip had increased time stability upon operation in solution, as compared with an unprotected SOI-NW chip with native oxide. The (h-k)-SOI-NW biosensor has been employed for the detection of DNA oligonucleotide (oDNA), which is a synthetic analogue of miRNA-21 associated with oncological diseases. To provide biospecificity of the detection, the surface of (h-k)-SOI-NW chip was modified with oligonucleotide probe molecules (oDVA probes) complementary to the sequence of the target biomolecule. Concentration sensitivity of the (h-k)-SOI-NW biosensor at the level of DL~10−16 M has been demonstrated.

1 April 2016 in Microelectronic Engineering
Verified
Journal Article
Closed access
MBM.A. Bruk
M.A. Bruk
EZE.N. Zhikharev
E.N. Zhikharev
ARAlexander Rogozhin
Alexander Rogozhin
DSD.R. Streltsov
D.R. Streltsov
VKV.A. Kalnov
V.A. Kalnov
ASA.V. Spirin
A.V. Spirin

26 July 2023 in Thin Solid Films
Verified
Journal Article
Closed access
AIAlexandr Isaev
Alexandr Isaev
OPO.о. Permyakova
O.о. Permyakova
ARAlexander Rogozhin
Alexander Rogozhin