This study establishes a robust small-angle neutron scattering (SANS) methodology for the quantitative characterization of γ matrix channel widths in the nickel-based single-crystal superalloy DD10. By combining SANS with TEM analyses and modeling the one-dimensional SANS data via a polydisperse lamellar model, we accurately determined the channel width distribution across macroscopic sample volumes. In the virgin state, the mean channel widths were nearly isotropic, measuring 17.8 ± 0.1 nm along [002] and 20.5 ± 0.1 nm along [020]. After standard heat treatment (solution and two-step aging), significant anisotropic coarsening was observed, with widths increasing to 36.8 ± 0.2 nm along [002] and 28.0 ± 0.1 nm along [020], indicating stress-free rafting. Elemental mapping revealed substantial redistribution of key alloying elements: Al content in γ′ precipitates increased by 2.6 at.%, while Cr in the γ channels rose by 5.9 at.%. These quantitative results demonstrate that SANS provides reliable, bulk-statistical insights into nanoscale channel geometry, highlighting its critical role in influencing elemental diffusion kinetics and microstructural evolution during thermal exposure.
The effect of grain boundaries on small-angle neutron scattering (SANS) was investigated for pure nickel. A series of annealed cold-rolled nickel samples were characterized by SANS, electron backscatter diffraction (EBSD), X-ray diffraction (XRD), and transmission electron microscopy (TEM). The experimental results indicate that the proportion of low-angle grain boundaries (LAGBs) has a noticeable influence on the scattering intensity. Cold-rolled samples exhibited a similar proportion of LAGBs, leading to only slight differences in scattering intensity. The scattering intensity was found to be dependent on annealing time and temperature. For samples with low degrees of recrystallization, a large number of LAGBs remained, resulting in high scattering intensity at low q. In contrast, samples with a high degree of recrystallization showed a significant reduction in LAGBs, which caused a noticeable decrease in SANS intensity.