More robust intelligent transportation systems including autonomous driving systems are in full flourish with the revolution of deep learning and the 6G wireless communication network. Vehicle Re-Identification, an indispensable branch of the intelligent transportation system, aims to retrieve specific vehicles captured from non-overlapping cameras. However, this is fundamentally challenging with the substantial inter-class similarity and substantial intra-class divergence. Embedding semantic information into vehicle re-identification task has gained ample interest, but the performance needs to be further improved. This work proposes a semantic-oriented feature coupling transformer (SOFCT) for vehicle re-identification as a solution. Specifically, the knowledge-based transformer is first embedded to model images with discriminative attributes. Second, original patches are divided into five semantic groups via semantics-patches coupling, and the feature extractions for different semantics are performed in the semantic feature extraction (SFE) transformer. Third, patch features are weighted via semantics-patches coupling in the patch feature weighting (PFW) transformer, the weighted feature is fed into subsequent encoders to excavate information. Finally, two groups of learnable semantics are embedded to automatically learn semantic features in the learnable semantic extraction (LSE) transformer. Experiments demonstrate that the proposed SOFCT method surpasses other state-of-the-arts with the mAP/Rank-1 of 80.7%/96.6%, 89.8%/84.5%, 86.4%/80.9%, and 84.3%/78.7% on VeRi776 and VehicleID.

The fine-grained attribute descriptions can significantly supplement the valuable semantic information for person image, which is vital to the success of person re-identification (ReID) task. However, current ReID algorithms typically failed to effectively leverage the rich contextual information available, primarily due to their reliance on simplistic and coarse utilization of image attributes. Recent advances in artificial intelligence generated content have made it possible to automatically generate plentiful fine-grained attribute descriptions and make full use of them. Thereby, this paper explores the potential of using the generated multiple person attributes as prompts in ReID tasks with off-the-shelf (large) models for more accurate retrieval results. To this end, we present a new framework called Multi-Prompts ReID (MP-ReID), based on prompt learning and language models, to fully dip fine attributes to assist ReID task. Specifically, MP-ReID first learns to hallucinate diverse, informative, and promptable sentences for describing the query images. This procedure includes (i) explicit prompts of which attributes a person has and furthermore (ii) implicit learnable prompts for adjusting/conditioning the criteria used towards this person identity matching. Explicit prompts are obtained by ensembling generation models, such as ChatGPT and VQA models. Moreover, an alignment module is designed to fuse multi-prompts (i.e., explicit and implicit ones) progressively and mitigate the cross-modal gap. Extensive experiments on the existing attribute-involved ReID datasets, namely, Market1501 and DukeMTMC-reID, demonstrate the effectiveness and rationality of the proposed MP-ReID solution.

A research of total ionizing dose and annealing effects on Schottky type p-GaN gate Al0.2Ga0.8N/GaN high electron mobility transistors (HEMTs) has been carried out. Devices with breakdown voltages of 100V/200V/650V were irradiated under Co-60 X-rays. Radiation doses reach to a total amount of 500 krad (Si) with dose rate of 50 rad(Si)/s under gate biases of ${V}_{GS}=0\text{V}$ /+3V/+5V. Negative threshold voltage shifts were observed, especially under positive gate biases. It is found out that the threshold voltage shifts are due to the accumulation of positive charges (holes) trapped in the interface of p-GaN/AlGaN. Therefore, the shift amount is proportional to the gate bias and the radiation amount, while not related to the breakdown voltage. After the total ionizing dose experiments, both high temperature and room temperature annealing processes were taken. During the annealing processes, the shifted threshold voltage recovered, and high temperature accelerated the recovery process. Experiment results indicate that the total ionizing dose effect is recoverable.