Polyvinylidene fluoride (PVDF) is a modern polymer material used in a wide variety of ways. Thanks to its excellent resistance to chemical or thermal degradation and low reactivity, it finds use in biology, chemistry, and electronics as well. By enriching the polymer with an easily accessible and cheap variant of graphite, it is possible to affect the ratio of crystalline phases. A correlation between the ratios of crystalline phases and different properties, like dielectric constant as well as piezo- and triboelectric properties, has been found, but the relationship between them is highly complex. These changes have been observed by a number of methods from structural, chemical and electrical points of view. Results of these methods have been documented to create a basis for further research and experimentation on the usability of this combined material in more complex structures and devices.

This paper presents polymer graphite (PG) as a novel material for the scanning tunneling microscopy (STM) probe. Conductive PG is a relatively modern nanocomposite material used for micro-pencil refills containing a polymer-based binding agent and graphite flakes. Its high conductivity and immunity against surface contamination, with a low price, make it seem like a highly suitable material for electrode manufacturing in general. For the tip production, three methods were developed and are further described in the paper. For the production, three commercially available polymer graphite rods were used. Each has been discussed in terms of performance within the tunneling microscope and within other potential applications.

This paper investigates field emission behavior from the surface of a tip that was prepared from polymer graphite nanocomposites subjected to electrochemical etching. The essence of the tip preparation is to create a membrane of etchant over an electrode metal ring. The graphite rod acts here as an anode and immerses into the membrane filled with alkali etchant. After the etching process, the tip is cleaned and analyzed by Raman spectroscopy, investigating the chemical composition of the tip. The topography information is obtained using the Scanning Electron Microscopy and by Field Emission Microscopy. The evaluation and characterization of field emission behavior is performed at ultra-high vacuum conditions using the Field Emission Microscopy where both the field electron emission pattern projected on the screen and current–voltage characteristics are recorded. The latter is an essential tool that is used both for the imaging of the tip surfaces by electrons that are emitted toward the screen, as well as a tool for measuring current–voltage characteristics that are the input to test field emission orthodoxy.