The aim of this study was to evaluate the influence of mineral and natural additives (2.5; 5; 10 wt.%) on the impact strength of epoxy–basalt composites. Three types of filler were used to modify the epoxy matrix: basalt powder (BP), basalt microfiber (BF) and sunflower husk ash (SA). The impact strength and the maximum force were determined for the materials. The results of the conducted research confirm that the addition of a powder fillers to the epoxy matrix of basalt fiber reinforced composites is an effective method of improving their impact characteristic. The introduction of fillers to epoxy resin allowed to improve the impact properties of all tested groups of laminates. Moreover, in all cases, the introduction of the filler increased the maximum force needed to damage the composite sample and their hardness. For the modified materials, an increase in impact strength was recorded, respectively: by 44% for composites with BP, by 7.5% for composites with BF and by 2.5% for composites with SA.

This work studies the direct current breakdown characteristics of unfilled epoxy and epoxy nonconductive nanocomposites (${\mathrm{S}\mathrm{i}\mathrm{O}}_2,\mathrm{M}\mathrm{g}\mathrm{O}$ and ${\mathrm{A}\mathrm{l}}_2{\mathrm{O}}_3$). It also examines the variation of electrical properties in epoxy nanocomposites. The novel aspect of this study is that the samples of Epoxy nanocomposite were exposed to high voltages of up to six kilo volts for three hours using field electron microscopy under high vacuum conditions (${10}^{-5}$ mbar). The current emitted from these samples was measured at three different intervals of time. In addition, the influence of high voltage on the permittivity, loss factor (tan(δ)), and conductivity of the epoxy nanocomposite was studied. This evaluation was conducted before and after applying the voltage at room temperature, The frequency range extends from ${10}^{-2}$–${10}^{-7}$ Hz using the Novo Control Alpha-A analyzer. Current–voltage characterization was performed through field electron microscopy. The samples were characterized by scanning electron microscopy–energy dispersive X-ray spectroscopy and Fourier Transform Infrared Spectroscopy. The unfilled epoxy exhibited structural degradation, resulting in the formation of holes when exposed to high voltages of up to six kilo volts, leading to a reduction in electrical properties. Nevertheless, the addition of nanoparticles shows a significant increase in the operational lifetime of the epoxy nanocomposite. The degree of increase in the lifetime of epoxy composite varied depending on several factors such as the type of NPs introduced and their respective sizes. The epoxy/${\mathrm{A}\mathrm{l}}_2{\mathrm{O}}_3$ nanocomposite comparing with epoxy/MgO and epoxy/${\mathrm{S}\mathrm{i}\mathrm{O}}_2$ nanocomposite showed elevated resistance to direct current breakdown strength and maintaining its dielectric.

This paper presents polymer graphite (PG) as a novel material for the scanning tunneling microscopy (STM) probe. Conductive PG is a relatively modern nanocomposite material used for micro-pencil refills containing a polymer-based binding agent and graphite flakes. Its high conductivity and immunity against surface contamination, with a low price, make it seem like a highly suitable material for electrode manufacturing in general. For the tip production, three methods were developed and are further described in the paper. For the production, three commercially available polymer graphite rods were used. Each has been discussed in terms of performance within the tunneling microscope and within other potential applications.

This paper investigates field emission behavior from the surface of a tip that was prepared from polymer graphite nanocomposites subjected to electrochemical etching. The essence of the tip preparation is to create a membrane of etchant over an electrode metal ring. The graphite rod acts here as an anode and immerses into the membrane filled with alkali etchant. After the etching process, the tip is cleaned and analyzed by Raman spectroscopy, investigating the chemical composition of the tip. The topography information is obtained using the Scanning Electron Microscopy and by Field Emission Microscopy. The evaluation and characterization of field emission behavior is performed at ultra-high vacuum conditions using the Field Emission Microscopy where both the field electron emission pattern projected on the screen and current–voltage characteristics are recorded. The latter is an essential tool that is used both for the imaging of the tip surfaces by electrons that are emitted toward the screen, as well as a tool for measuring current–voltage characteristics that are the input to test field emission orthodoxy.