Graduated with a degree in physics from the Federal University of Espírito Santo (UFES) in 2014 and with master's and doctoral degrees in science (plasma physics) from the Technological Institute of Aeronautics (ITA), in 2017 and 2021, respectively. He is currently a substitute professor of physics at the Federal Technological University of Paraná (UTFPR). He has experience in physics, with emphasis on plasma physics and condensed matter physics, acting in the following subjects: thin film deposition (physical vapor deposition/magnetron sputtering, plasma-enhanced chemical vapor deposition (PECVD), and spin coating), treatment surface of materials (PECVD and reactive ion etching (RIA)), characterization and study of the properties of nanomaterials by means of scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive X-ray spectroscopy (EDS/EDX), X-ray excited photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy (FTIR), X-ray diffraction (XRD), Raman spectroscopy, goniometry, mechanical profilometry, ellipsometry, and four-point resistivity measurement. He also has experience in the application of nanostructured thin films as well as in nanoparticles/nanotubes, photovoltaic devices, and photocatalysis. In teaching, he has experience in teaching physics and mathematics.
Graduated with a degree in physics from the Federal University of Espírito Santo (UFES) in 2014 and with master's and doctoral degrees in science (plasma physics) from the Technological Institute of Aeronautics (ITA), in 2017 and 2021, respectively. He is currently a substitute professor of physics at the Federal Technological University of Paraná (UTFPR). He has experience in physics, with emphasis on plasma physics and condensed matter physics, acting in the following subjects: thin film deposition (physical vapor deposition/magnetron sputtering, plasma-enhanced chemical vapor deposition (PECVD), and spin coating), treatment surface of materials (PECVD and reactive ion etching (RIA)), characterization and study of the properties of nanomaterials by means of scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive X-ray spectroscopy (EDS/EDX), X-ray excited photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy (FTIR), X-ray diffraction (XRD), Raman spectroscopy, goniometry, mechanical profilometry, ellipsometry, and four-point resistivity measurement. He also has experience in the application of nanostructured thin films as well as in nanoparticles/nanotubes, photovoltaic devices, and photocatalysis. In teaching, he has experience in teaching physics and mathematics.