Yuan Cao

Dr. Yuan Cao

orcid

Research Focus & Metrics

Academic Career Length

13Years (2014-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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4 July 2019 in IEEE Transactions on Information Forensics and Security
Verified
Journal Article
Closed access
YZYue Zheng
Yue Zheng
Yuan CaoYuan Cao
Yuan Cao
Chip Hong ChangChip Hong Chang
Chip Hong Chang
With the increasing prevalent of digital devices and their abuse for digital content creation, forgeries of digital images and video footage are more rampant than ever. Digital forensics is challenged into seeking advanced technologies for forgery content detection and acquisition device identification. Unfortunately, existing solutions that address image tampering problems fail to identify the device that produces the images or footage while techniques that can identify the camera is incapable of locating the tampered content of its captured images. In this paper, a new perceptual data-device hash is proposed to locate maliciously tampered image regions and identify the source camera of the received image data as a non-repudiable attestation in digital forensics. The presented image may have been either tampered or gone through benign content preserving geometric transforms or image processing operations. The proposed image hash is generated by projecting the invariant image features into a physical unclonable function (PUF)-defined Bernoulli random space. The tamper-resistant random PUF response is unique for each camera and can only be generated upon triggered by a challenge, which is provided by the image acquisition timestamp. The proposed hash is evaluated on the modified CASIA database and CMOS image sensor based PUF simulated using 180nm TSMC technology. It achieves a high tamper detection rate of 95:42% with the regions of tampered content successfully located, a good authentication performance of above 98:5% against standard content-preserving manipulations, and 96:25% and 90:42%, respectively for the more challenging geometric transformations of rotation (0 ~ 360°) and scaling (scale factor in each dimension: 0:5). It is demonstrated to be able to identify the source camera with 100% accuracy and is secure against attacks on PUF.

17 August 2018 in IEEE Transactions on Circuits and Systems I: Regular Papers
Verified
Journal Article
Closed access
Yuan CaoYuan Cao
Yuan Cao
CLChaoqun Liu
Chaoqun Liu
Chip Hong ChangChip Hong Chang
Chip Hong Chang
Strong physical unclonable function (PUF) transcends the limitations of legacy secure key storage methods as emerging security primitive for cryptography and device identification/authentication. In this paper, a new low power and reliable mono-stable strong PUF is proposed. Its primary entropy is derived from the process variations of the parallel diode-clamped single inverter ring working in the subthreshold region. Due to manufacturing process variations, the monostable state of the output voltage of single inverter ring is Gaussian distributed around the half Vdd point. The spread of the Gaussian is broadened by mixing it with another Gaussian distributed trip point obtained from a diode-clamped parallel inverter stage. As the main entropy of the raw response bits is derived from a mono-stable circuit, it has greater immunity to perturbances introduced by operating environments. In addition, as the mono-stable state for the output voltage is a non-linear combination of individual inverter rings, the resilience against machine learning attacks can be improved. The prototype chip was fabricated using a commercial 40-nm CMOS technology. The measurement results show that the power consumption of the 64-bit mono-stable PUF is merely 3.85 μW. The native bit error rate is <;8% at 0.9 ~ 1.3 V and -40~ 90°C, which can be further reduced to <;1% using the proposed thresholding technique. The proposed PUF reduces the accuracy of support vector machine and reliability-based covariance matrix adaptation evolution strategy attacks by 36× and 75×, respectively, over that of arbiter PUF.

15 June 2021 in IEEE Transactions on Circuits and Systems I: Regular Papers
Verified
Journal Article
Closed access
Yuan CaoYuan Cao
Yuan Cao
XZXiaojin Zhao
Xiaojin Zhao
WZWenhan Zheng
Wenhan Zheng
YZYue Zheng
Yue Zheng
Chip Hong ChangChip Hong Chang
Chip Hong Chang
Oscillator-based elementary true random number generator (TRNG) uses a slow jittery ring oscillator (RO) to sample a fast RO. The ROs are always on but most of the oscillatory cycles of the fast RO are not sampled into random bits. In this paper, a new lightweight TRNG design is proposed to minimize the power wasted by the superfluous oscillations. Random bits are extracted from both phases of the slow ROs to increase the throughput and the fast RO is activated only during the narrow transition time difference between two symmetrically designed slow ROs. The slow jittery ROs are implemented using current starved inverters biased in the weak inversion region to reduce their power consumption. Their jitter amplitudes are increased by lowering the oscillation frequency and reducing the drain current of the transistors. The narrow jittery pulse generated by the differential pair of slow ROs is quantized by the fastest three-stage RO. Two random bits from each phase of the jittery ROs can be extracted by using a gigahertz dynamic toggled D flip-flop counter to count the number of oscillatory cycles of the fast RO. The proposed TRNG is fabricated in a standard 65 nm 1.2 V CMOS process. Measurement results of the fabricated chips show that the proposed TRNG consumes merely $260~\mu \text{W}$ at a bit rate of 52 Mbps. It outperforms the state-of-art on-chip jitter-based TRNGs with the best figure-of-merit of 5 pJ/bit and the smallest footprint of $366~\mu \text{m}^{2}$ . Its generated bit sequence passes the statistical randomness tests including National Institute of Standards and Technology (NIST) test, Auto Correlation Factor (ACF) test and bias. The mean redundancy of the ten tested chips is measured to be less than 10 −5 bit/symbol.

30 October 2022 in Entropy
Verified
Journal Article
Open access
PDF file
Yuan CaoYuan Cao
Yuan Cao
WLWanyi Liu
Wanyi Liu
LQLan Qin
Lan Qin
BLBingqiang Liu
Bingqiang Liu
SCShuai Chen
Shuai Chen
WCWang Chao
Wang Chao
Entropy is a measure of uncertainty or randomness. It is the foundation for almost all cryptographic systems. True random number generators (TRNGs) and physical unclonable functions (PUFs) are the silicon primitives to respectively harvest dynamic and static entropy to generate random bit streams. In this survey paper, we present a systematic and comprehensive review of different state-of-the-art methods to harvest entropy from silicon-based devices, including the implementations, applications, and the security of the designs. Furthermore, we conclude the trends of the entropy source design to point out the current spots of entropy harvesting.

9 November 2018 in IEEE Access
Verified
Journal Article
Open access
Yuan CaoYuan Cao
Yuan Cao
YGYuan Gao
Yuan Gao
RTRongjun Tan
Rongjun Tan
QHQingbang Han
Qingbang Han
ZLZhuotao Liu
Zhuotao Liu
Defending against distributed denial of service (DDoS) attacks in the Internet is a fundamental problem. One practical approach to addressing DDoS attacks is to redirect all destination (e.g., via DNS or BGP) to a third-party, DDoS protection-as-a-service provider (e.g., Cloudflare and Akamai) that is well provisioned and equipped with proprietary filtering mechanisms to remove attack traffic before passing the remaining traffic to the destination. Although such an approach is appealing, as it requires no modification to the existing Internet infrastructure and can scale to handle very large attacks, recent industrial interviews with more than 100 interviewees from over 10 industry segments reveal that this approach alone is not sufficient, especially for large organizations (e.g., web hosting companies, government) that cannot afford to allow third-parity security-service providers to terminate their network connections. Instead, these organizations have to rely on their ISPs to filter attack traffic. In this paper, we discuss the challenges faced by the ISPs in order to disrupt the Internet security-service market and sketch our solutions, powered by smart contracts.

16 July 2020 in IEEE Transactions on Circuits and Systems I: Regular Papers
Verified
Journal Article
Closed access
QZQiang Zhao
Qiang Zhao
WZWenhan Zheng
Wenhan Zheng
XZXiaojin Zhao
Xiaojin Zhao
Yuan CaoYuan Cao
Yuan Cao
FZFeng Zhang
Feng Zhang
MLMan-Kay Law
Man-Kay Law
In this paper, we present a fully reconfigurable resistive random access memory (RRAM) physical unclonable function (PUF) based on the truly random dynamic entropy of the ubiquitous jitter noise, which is intrinsically different from most previously demonstrated PUF implementations with semiconductor fabrication's process variation as the static entropy source. In addition, the proposed RRAM PUF is operated by configuring the mainstream RRAM cells to either high resistance state (for `1') or low resistance state (for `0'), according to the customized ring oscillator (RO) true random number generator's digital output that is determined by the random jitter noise. By completely removing the need of dedicated split resistance circuitry (SRC) in existing RRAM PUFs, the proposed implementation is fully compatible with the SET/RESET operations of the RRAM array for mainstream memory applications, leading to minimized design overhead and enhanced reliability without SRC-caused error bits. Fabricated using 130 nm standard complementary-metal-oxide-semiconductor (CMOS) process plus post-processing dedicated to the RRAM devices, the proposed RRAM PUF cell features an ultra-compact footprint of 1.82 μm² (i.e., 108 F²), which is capable of generating ~10⁷ PUF bits per cell due to the time-variant property of jitter noise and the full reconfigurability of the RRAM PUF. This significantly innovates all the previous weak PUF implementations based on the static entropy source of process variation, where the maximum bit number per PUF cell is always limited and fixed after the chip fabrication. Meanwhile, ultra-low native unstable bits of 0.28% and bit error rate (BER) per 10°C of 0.03% can be achieved for the fabricated RRAM PUF. Moreover, by passing the widely-adopted bias test, National Institute of Standards and Technology (NIST) test and autocorrelation function (ACF) test under various VT conditions, the true randomness of the customized RO TRNG' dynamic entropy is validated using 65 nm standard CMOS process. Compared with the state-of-the-art weak PUF implementations, the native unstable bits is improved by 5.36x and the BER per 10°C is improved by 4x, even under the widest operating temperature range from -50°C to 150°C.