Didier Théron

Dr. Didier Théron

CNRS-IEMN
orcid

Research Focus & Metrics

Academic Career Length

38Years (1989-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

View All Publications
11 September 2014 in Journal of Microelectromechanical Systems
Verified
Journal Article
Open access
MRMina Rais-Zadeh
Mina Rais-Zadeh
VGVikrant Gokhale
Vikrant Gokhale
AAAzadeh Ansari
Azadeh Ansari
MFMarc Faucher
Marc Faucher
DTDidier Théron
Didier Théron
LBLionel Buchaillot
Lionel Buchaillot
Gallium nitride (GaN) is a wide bandgap semiconductor material and is the most popular material after silicon in the semiconductor industry. The prime movers behind this trend are LEDs, microwave, and more recently, power electronics. New areas of research also include spintronics and nanoribbon transistors, which leverage some of the unique properties of GaN. GaN has electron mobility comparable with silicon, but with a bandgap that is three times larger, making it an excellent candidate for high-power applications and high-temperature operation. The ability to form thin-AlGaN/GaN heterostructures, which exhibit the 2-D electron gas phenomenon leads to high-electron mobility transistors, which exhibit high Johnson's figure of merit. Another interesting direction for GaN research, which is largely unexplored, is GaN-based micromechanical devices or GaN microelectromechanical systems (MEMS). To fully unlock the potential of GaN and realize new advanced all-GaN integrated circuits, it is essential to cointegrate passive devices (such as resonators and filters), sensors (such as temperature and gas sensors), and other more than Moore functional devices with GaN active electronics. Therefore, there is a growing interest in the use of GaN as a mechanical material. This paper reviews the electromechanical, thermal, acoustic, and piezoelectric properties of GaN, and describes the working principle of some of the reported high-performance GaN-based microelectromechanical components. It also provides an outlook for possible research directions in GaN MEMS.

15 January 2010 in Journal of Applied Physics
Verified
Journal Article
Closed access
PDF file
AFAbdel El Fatimy
Abdel El Fatimy
NDN. Dyakonova
N. Dyakonova
YMY. Meziani
Y. Meziani
TOTaiichi Otsuji
Taiichi Otsuji
WKW. Knap
W. Knap
CSC. Skierbiszewski
C. Skierbiszewski
We report on room temperature terahertz generation by a submicron size AlGaN/GaN-based high electron mobility transistors. The emission peak is found to be tunable by the gate voltage between 0.75 and 2.1 THz. Radiation frequencies correspond to the lowest fundamental plasma mode in the gated region of the transistor channel. Emission appears at a certain drain bias in a thresholdlike manner. Observed emission is interpreted as a result of Dyakonov–Shur plasma wave instability in the gated two-dimensional electron gas.

1 February 2001 in IEEE Electron Device Letters
Verified
Journal Article
Closed access
IDI. Daumiller
I. Daumiller
DTDidier Théron
Didier Théron
CGChristophe Gaquiere
Christophe Gaquiere
AVAndrei Vescan
Andrei Vescan
RDR. Dietrich
R. Dietrich
EKE. Kohn
E. Kohn
Current dispersion effects have been experimentally investigated in a variety of AlGaN/GaN heterostructure FETs with large signal and switching measurements including HEMTs with doped and undoped barrier layer. A range of dispersion frequencies from 10/sup -3/ Hz to 10 GHz were observed, where the output current amplitude is drastically reduced. Through this effect the full channel charge of an AlGaN/GaN heterostructure FET may be completely depleted under specific bias conditions. This indicates that this phenomena cannot be related to deep traps alone, but is also connected to piezorelated charge states and conduction to these states.

3 April 2006 in Applied Physics Letters
Verified
Journal Article
Closed access
NDN. Dyakonova
N. Dyakonova
AFAbdel El Fatimy
Abdel El Fatimy
JŁJ. Łusakowski
J. Łusakowski
WKW. Knap
W. Knap
MDM. I. Dyakonov
M. I. Dyakonov
ACA. Cappy
A. Cappy
Room-temperature generation of terahertz radiation in nanometer gate length InAlAs∕InGaAs and AlGaN∕GaN high-mobility transistors is reported. A well-defined source-drain voltage threshold for the emission exists, which depends on the gate bias. Spectral analysis of the emitted radiation is presented. The highest emission power emitted from a single device reached 0.1μW.

3 October 2016 in Nature Communications
Verified
Journal Article
Open access
JTJorge Trasobares
Jorge Trasobares
DVDominique Vuillaume
Dominique Vuillaume
DTDidier Théron
Didier Théron
NCN. Clément
N. Clément
Molecular electronics originally proposed that small molecules sandwiched between electrodes would accomplish electronic functions and enable ultimate scaling to be reached. However, so far, functional molecular devices have only been demonstrated at low frequency. Here, we demonstrate molecular diodes operating up to 17.8 GHz. Direct current and radio frequency (RF) properties were simultaneously measured on a large array of molecular junctions composed of gold nanocrystal electrodes, ferrocenyl undecanethiol molecules and the tip of an interferometric scanning microwave microscope. The present nanometre-scale molecular diodes offer a current density increase by several orders of magnitude compared with that of micrometre-scale molecular diodes, allowing RF operation. The measured S11 parameters show a diode rectification ratio of 12 dB which is linked to the rectification behaviour of the direct current conductance. From the RF measurements, we extrapolate a cut-off frequency of 520 GHz. A comparison with the silicon RF-Schottky diodes, architecture suggests that the RF-molecular diodes are extremely attractive for scaling and high-frequency operation.

9 November 2006 in Electronics Letters
Verified
Journal Article
Closed access
AFAbdel El Fatimy
Abdel El Fatimy
STS. Boubanga Tombet
S. Boubanga Tombet
FTF. Teppe
F. Teppe
WKW. Knap
W. Knap
DVD.B. Veksler
D.B. Veksler
ACA. Cappy
A. Cappy
Detection of subterahertz and terahertz radiation by high electron mobility GaN/AlGaN transistors in the 0.2–2.5 THz frequency range (much higher than the cutoff frequency of the transistors) is reported. Experiments were performed in the temperature range 4–300 K. For the lowest temperatures, a resonant response was observed. The resonances were interpreted as plasma wave excitations in gated two-dimensional electron gas. Non-resonant detection was observed at temperatures above 100 K. Estimates for noise equivalent power show that these transistors can be used as efficient detectors of terahertz radiation at cryogenic and room temperatures.