In this study, zinc phthalocyanine (ZnPc) and copper phthalocyanine (CuPc) thin films fabricated by drop casting (DC) and close space sublimation (CSS) have been investigated and compared with ZnPc and CuPc solutions in formic acid (29 µmol/L). The results show that the CSS method produces films with improved molecular ordering, enhanced surface uniformity, superior optical and morphological properties compared to those obtained by drop casting. Moreover, CSS allows a precise and reproducible deposition, resulting in thinner, homogeneous layers with strong substrate adhesion and fewer defects. Optical characterization confirms that CSS films display high transparency (~90%), a sharp Q-band around 680 nm, and a fluorescence maximum at ~825 nm with the strongest emission intensity.In contrast, DC films show lower transparency (<70%), a slightly shifted Q-band (~675 nm), and similar emission around 825 nm. The fluorescence is strongly thickness-dependent: at ~100 nm, the emission band appears at 795 nm, while films thicker than 300 nm exhibit a red-shifted maximum at ~825 nm. AFM analysis further demonstrates the influence of deposition method: CSS yields smoother films with tunable morphology, while DC produces rougher, less controllable surfaces. Overall, CSS is shown to be the more effective approach for fabricating high-quality phthalocyanine films for optoelectronic applications such as photovoltaics and sensors.

This study presents a comprehensive investigation of the structural, morphological, and optical properties of aluminum phthalocyanine (AlPc) and silicon phthalocyanine (SiPc) thin films prepared by the close space sublimation (CSS) method, deposited at different evaporator temperatures of 350 °C, 400 °C, and 450 °C, including heterostructures incorporating an indium tin oxide (ITO) layer. Scanning electron microscopy revealed a clear temperature-dependent evolution of surface morphology, with both materials transitioning from isolated crystallites to dense, highly crystalline films. SiPc exhibited higher nucleation density and earlier film densification, while AlPc showed more pronounced grain growth at elevated temperatures, accompanied by crack formation due to internal stress. Optical absorption spectra indicated a red shift in absorption maxima with increasing deposition temperature, associated with improved crystallinity and reduced defect density. The presence of ITO significantly modified the optical response, introducing additional absorption features in the near-infrared region due to interference effects and free-carrier contributions. Fluorescence measurements revealed enhanced emission intensity with increasing temperature for AlPc, while SiPc showed weaker emission overall. The incorporation of ITO led to substantial fluorescence enhancement and the appearance of additional near-infrared emission bands, highlighting the importance of interface engineering. Transmittance spectra demonstrated that ITO-based heterostructures provide a balance between transparency and absorption, with selective attenuation in the 600–800 nm range, enabling band-stop filter behavior. Raman analysis revealed opposite temperature-dependent trends: increasing structural order in AlPc and gradual disorder in SiPc. X-ray diffraction confirmed the crystalline nature of both materials, showing temperature-induced improvements in crystallinity and crystallite size, as well as distinct differences in molecular packing and preferred orientation. These results demonstrate the potential of AlPc and SiPc thin films as functional optical materials with tunable structural and optical properties.