Razvan Pascu

Dr. Razvan Pascu

National Institute for Research and Development in Microtechnologies - IMT Bucharest
orcid

Research Focus & Metrics

Academic Career Length

16Years (2011-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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21 August 2017 in ACS Applied Materials & Interfaces
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Journal Article
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IMIuliana Mihalache
Iuliana Mihalache
ARAntonio Radoi
Antonio Radoi
Razvan PascuRazvan Pascu
Razvan Pascu
Cosmin RomanitanCosmin Romanitan
Cosmin Romanitan
EVEugenia Vasile
Eugenia Vasile
MKMihaela Kusko
Mihaela Kusko

25 June 2018 in Scientific Reports
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Journal Article
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Cosmin RomanitanCosmin Romanitan
Cosmin Romanitan
PVPericle Varasteanu
Pericle Varasteanu
IMIuliana Mihalache
Iuliana Mihalache
DCDaniela Culita
Daniela Culita
SSSimona Somacescu
Simona Somacescu
MKMihaela Kusko
Mihaela Kusko
The challenge for conformal modification of the ultra-high internal surface of nanoporous silicon was tackled by electrochemical polymerisation of 2,6-dihydroxynaphthalene using cyclic voltammetry or potentiometry and, notably, after the thermal treatment (800 °C, N2, 4 h) an assembly of interconnected networks of graphene strongly adhering to nanoporous silicon matrix resulted. Herein we demonstrate the achievement of an easy scalable technology for solid state supercapacitors on silicon, with excellent electrochemical properties. Accordingly, our symmetric supercapacitors (SSC) showed remarkable performance characteristics, comparable to many of the best high-power and/or high-energy carbon-based supercapacitors, their figures of merit matching under battery-like supercapacitor behaviour. Furthermore, the devices displayed high specific capacity values along with enhanced capacity retention even at ultra-high rates for voltage sweep, 5 V/s, or discharge current density, 100 A/g, respectively. The cycling stability tests performed at relatively high discharge current density of 10 A/g indicated good capacity retention, with a superior performance demonstrated for the electrodes obtained under cyclic voltammetry approach, which may be ascribed on the one hand to a better coverage of the porous silicon substrate and, on the other hand, to an improved resilience of the hybrid electrode to pore clogging.

1 May 2019 in Materials Science in Semiconductor Processing
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GPG. Pristavu
G. Pristavu
GBG. Brezeanu
G. Brezeanu
Razvan PascuRazvan Pascu
Razvan Pascu
FDF. Drăghici
F. Drăghici
MBM. Bădilă
M. Bădilă

22 August 2017 in Journal of Applied Physics
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Journal Article
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GBG. Brezeanu
G. Brezeanu
Gheorghe PristavuGheorghe Pristavu
Gheorghe Pristavu
FDF. Draghici
F. Draghici
MBM. Badila
M. Badila
Razvan PascuRazvan Pascu
Razvan Pascu
In this paper, a characterization technique for 4H-SiC Schottky diodes with varying levels of metal-semiconductor contact inhomogeneity is proposed. A macro-model, suitable for high-temperature evaluation of SiC Schottky contacts, with discrete barrier height non-uniformity, is introduced in order to determine the temperature interval and bias domain where electrical behavior of the devices can be described by the thermionic emission theory (has a quasi-ideal performance). A minimal set of parameters, the effective barrier height and peff, the non-uniformity factor, is associated. Model-extracted parameters are discussed in comparison with literature-reported results based on existing inhomogeneity approaches, in terms of complexity and physical relevance. Special consideration was given to models based on a Gaussian distribution of barrier heights on the contact surface. The proposed methodology is validated by electrical characterization of nickel silicide Schottky contacts on silicon carbide (4H–SiC), where a discrete barrier distribution can be considered. The same method is applied to inhomogeneous Pt/4H–SiC contacts. The forward characteristics measured at different temperatures are accurately reproduced using this inhomogeneous barrier model. A quasi-ideal behavior is identified for intervals spanning 200 °C for all measured Schottky samples, with Ni and Pt contact metals. A predictable exponential current-voltage variation over at least 2 orders of magnitude is also proven, with a stable barrier height and effective area for temperatures up to 400 °C. This application-oriented characterization technique is confirmed by using model parameters to fit a SiC-Schottky high temperature sensor's response.

1 July 2019 in Dyes and Pigments
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MDMariana-Dana Damaceanu
Mariana-Dana Damaceanu
CCCatalin-Paul Constantin
Catalin-Paul Constantin
ABAndra-Elena Bejan
Andra-Elena Bejan
MMMihai Mihaila
Mihai Mihaila
MKMihaela Kusko
Mihaela Kusko
Razvan PascuRazvan Pascu
Razvan Pascu

24 May 2019 in Sensors
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FDFlorin Draghici
Florin Draghici
Gheorghe BrezeanuGheorghe Brezeanu
Gheorghe Brezeanu
Gheorghe PristavuGheorghe Pristavu
Gheorghe Pristavu
Razvan PascuRazvan Pascu
Razvan Pascu
MBMarian Badila
Marian Badila
ECEmilian Ceuca
Emilian Ceuca
This paper presents a high-temperature probe suitable for operating in harsh industrial applications as a reliable alternative to low-lifespan conventional solutions, such as thermocouples. The temperature sensing element is a Schottky diode fabricated on 4H-SiC wafers, with Ni as the Schottky metal, which allows operation at temperatures up to 400 °C, with sensitivities over 2 mV/°C and excellent linearity (R2 > 99.99%). The temperature probe also includes dedicated circuitry for signal acquisition and conversion to the 4 mA–20 mA industrial standard output signal. This read-out circuit can be calibrated for linear response over a tunable temperature detection range. The entire system is designed for full electrical and mechanical compatibility with existing conventional probe casings, allowing for seamless implementation in a factory’s sensor network. Such sensors are tested alongside standard thermocouples, with matching temperature monitoring results, over several months, in real working conditions (a cement factory), up to 400 °C.