jaekwon kim

Dr. jaekwon kim

Samsung Electronics Co., Ltd.
orcid

Research Focus & Metrics

Academic Career Length

9Years (2018-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 October 2019 in IEEE Transactions on Circuits and Systems I: Regular Papers
Verified
Journal Article
Closed access
JKjaekwon kim
jaekwon kim
WJWoojin Jang
Woojin Jang
YLYanghoon Lee
Yanghoon Lee
WKWan Kim
Wan Kim
SOSeunghyun Oh
Seunghyun Oh
TCThomas Byunghak Cho
Thomas Byunghak Cho
A 14-nm FinFET CMOS 12-b current-steering digital-to-analog converter (DAC) for 2G/3G/4G cellular applications is presented herein. Bit segmentations of a 6-bit thermometer and 6-bit binary coding are adopted, utilizing switching-order shuffling in combination with dynamic element matching (DEM) to suppress the spurious tones owing to the current-source mismatch in three-dimensional FinFETs. In addition, output switches are designed to achieve make-before-break operation with the proposed low crossing point level shifter. Moreover, an output full-scale current trimming method is applied to maximize the power efficiency of the envelope-tracking (ET). The active area of a single DAC is 0.036 mm², its power consumption is 6.1 mW, and its SFDR is 80 dBc.

1 September 2018
Verified
Conference Paper
Closed access
Jahoon JinJahoon Jin
Jahoon Jin
JKjaekwon kim
jaekwon kim
HKHyeran Kim
Hyeran Kim
CPCanxing Piao
Canxing Piao
JCJaemin Choi
Jaemin Choi
JCJung-Hoon Chun
Jung-Hoon Chun
This paper proposes a continuous-rate referenceless clock and data recovery (CDR) circuit operating in the half-rate clocking mode with a jitter-tolerant frequency acquisition technique. The proposed coarse frequency detector reduces frequency error below 40,000 ppm without any sub-harmonic lock even when the input jitter presents up to 0.6 UI pp . The deadzone-compensated frequency detector further reduces the residual frequency error below 1,000 ppm for the following PLL's reliable operation. The CDR fabricated in a 28-nm CMOS process shows a wide capture range of 4.0 Gb/s to 10.0 Gb/s with a bit error rate (BER) under 10 -12 .

11 February 2022 in Electronics
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Journal Article
Open access
PDF file
JKjaekwon kim
jaekwon kim
YKYoungjun Ko
Youngjun Ko
Jahoon JinJahoon Jin
Jahoon Jin
JCJaehyuk Choi
Jaehyuk Choi
JCJung-Hoon Chun
Jung-Hoon Chun
A referenceless digital clock and data recovery (D-CDR) circuit using a half-rate jitter-tolerant frequency detector (FD) and a multi-bit decimator is presented. For a referenceless configuration, we introduced a half-rate jitter-tolerant digital quadricorrelator frequency detector (JT-DQFD). Additionally, we proposed a multi-bit decimator circuit that losslessly down-samples up/down data from a phase detector to reduce the recovered clock jitter. The down-sampled multi-bit phase information is processed by a digital loop filter to adjust the phase of the recovered clock. Fabricated in a 28-nm CMOS technology, the test chip achieves a power efficiency of 1.3 pJ/bit at 10 Gb/s.