This paper presents a new family of Class-AB operational transconductance amplifier (OTA) circuits based on single-stage topologies with non-linear current amplifiers. The proposed variable-mirror amplifier (VMA) architecture is mainly characterized by generating all Class-AB current in the output transistors only, by exhibiting very low sensitivity to both technology and temperature deviations, and by avoiding the need for any internal frequency-compensation mechanism. Hence, this family of OTAs is well-suited for low-power switched-capacitor circuits and specifically optimized for switched-OpAmp fast on-off operation and multi-decade load-capacitance specifications. Analytical expressions valid in all regions of operation are presented to minimize VMA settling time in discrete-time circuits. Also, a complete OTA design example integrated in 0.18 μm 1P6M MiM 1.8 V CMOS technology is supplied with detailed simulation and experimental results. Compared to resistor-free state-of-art Class-AB OpAmp and OTA literature, the proposed architecture returns the highest measured figure-of-merit value.

Wafer-scale nanostencil lithography (nSL) is used to define several types of silicon mechanical resonators, whose dimensions range from 20 µm down to 200 nm, monolithically integrated with CMOS circuits. We demonstrate the simultaneous patterning by nSL of ∼2000 nanodevices per wafer by post-processing standard CMOS substrates using one single metal evaporation, pattern transfer to silicon and subsequent etch of the sacrificial layer. Resonance frequencies in the MHz range were measured in air and vacuum. As proof-of-concept towards an application as high performance sensors, CMOS integrated nano/micromechanical resonators are successfully implemented as ultra-sensitive areal mass sensors. These devices demonstrate the ability to monitor the deposition of gold layers whose average thickness is smaller than a monolayer. Their areal mass sensitivity is in the range of 10(-11) g cm(-2) Hz(-1), and their thickness resolution corresponds to approximately a thousandth of a monolayer.

This paper presents a true very low-voltage low-power complete analog hearing-aid system-on-chip as a demonstrator of novel analog CMOS circuit techniques based on log companding processing and using MOS transistors operating in subthreshold. Low-voltage circuit implementations are given for all of the required functions including amplification and automatic gain control filtering, generation, and pulse-duration modulation. Based on these blocks, a single 1-V 300-/spl mu/A application specific integrated circuit integrating a complete hearing aid in a standard 1.2-/spl mu/m CMOS technology is presented along with exhaustive experimental data. To the authors' knowledge, the presented system is the only CMOS hearing aid with true internal operation at the battery supply voltage and with one of the lowest current consumptions reported in literature. The resulting low-voltage CMOS circuit techniques may also be applied to the design of A/D converters for digital hearing aids.

This paper presents a low-power all-MOS delta-sigma ADC specifically optimized for the potentiostatic biasing and amperometric read-out of electrochemical sensors. The proposed architecture reuses the dynamic properties of the sensor itself to implement a continuous-time mixed electrochemical delta-sigma modulator with minimalist analog circuits fully integrable in purely digital CMOS technologies. A 25-μW smart electrochemical sensor demonstrator integrated in low-cost 1M CMOS technology with Au post-processing is presented. Experimental results show electrical dynamic range values exceeding 10-bit, while electrochemical figures exhibit linearity levels close to R² = 0.999 combined with RSD <; 15% in terms of reproducibility. A comparative test with commercial potentiostat equipment is also included to qualify the performance of the proposed ADC.

This brief presents a fully integrated nanoelectromechanical system (NEMS) resonator, operable at frequencies in the megahertz range, together with a compact built-in CMOS interfacing circuitry. The proposed low-power second-generation current conveyor circuit allows detailed read-out of the nanocantilever structure for either extraction of equivalent circuit models or comparative studies at different pressure and dc biasing conditions. In this sense, extensive experimental results are presented for a real mixed electromechanical system integrated through a combination of in-house standard CMOS technology and nanodevice post-processing by nanostencil lithography. The proposed read-out scheme can be easily adapted to operate the nanocantilever in closed loop operation as a stand-alone NEMS oscillator