There exist over 2 GW of photovoltaic (PV) systems in the Czech Republic, exposed to moderate continental climate. Although there exist many PV modules defects, thanks to the generally the same production year 2009, only some of them are usual at systems installed in Czech Republic. This work shows delamination failures that are frequent in moderate climate conditions. Special account is taken into edge delamination defect and its possible propagation in modules of standard construction. Combined PV panel and PV inverter failure is caused by edge delamination with water penetration and high string voltage. The electric discharge channel is created between the string of solar panels and the grounded PV panel frames. The result of the discharge channel created because of edge delamination is inverter switch- off and few months later total destruction of the inverter because of protective relay damage. The number of combined PV panel and PV inverter failures is increasing substantially after ninth year of operation of PV panels in moderate climate. Additional sealing of the PV panel frames by transparent polysiloxane gel reduced the number of combined PV panel and PV inverter failures very substantially.

A vast majority of PV panel suppliers declare a PV panel lifetime in the range of 20-30 years (typically 25 years). Our data from long-term monitoring of many PV power plants indicate that first-tier PV panels at many PV power plants, in moderate climate, start to fail after about 10-12 years....

Potential induced degradation (PID) is a serious threat for the photovoltaic (PV) industry. The risk of PID may increase with increasing operating voltage of PV systems. Although PID tests are currently standard tests, the expansion of floating PV power plants and installation in humid climates show that PID-free modules are still sensitive to this type of degradation. Therefore, a method that can detect PID in the initial phase before standard tests reveal it, is necessary to increase the reliability of PV systems and maintain their lifetime. One possible tool for revealing early-stage PID manifestations is impedance spectroscopy and I-V dark curves measurements. Both IS and dark current measurement methods are sensitive to cell shunt resistance (R_SH), which is strongly influenced by PID before significant power loss and can act as an early stage PID detection mechanism. The paper describes the differences of the common P-type PV module parameters both during the degradation process and also during the regeneration process when diagnosed by conventional and IS and dark current measurement methods.

We show that two-terminal multijunction cells interconnected by tunnel junctions are fairly immune to individual local shunts, thanks to the shunt quenching. Interestingly, they may still suffer from global shunts. We revise the paradigm of a multijunction cell as a simple serial connection of component cells. This paradigm remains valid only for multijunction cells with laterally conductive interlayers. Instead, a new equivalent circuit is proposed and verified by measurement and simulations. As a main approach, selective illumination is applied and the voltage is measured at the end terminals. The global shunt is seen as a shift from logarithmic to linear intensity response. The presence of tunnel junction is important for an optimum configuration of tandem structures such as metal-halide perovskite with crystalline silicon solar cell.

This article presents an innovative and highly sustainable method for recycling photovoltaic (PV) panels laminated with very soft polydimethylsiloxane (PDMS) gels. This approach eliminates energy-intensive and environmentally harmful processes such as burning and chemical etching due to simple and clean mechanical delamination at room temperature via polyethylene wedges. This technology significantly contributes to environmental sustainability by facilitating the direct reuse of materials, reducing the amount of hazardous waste, and minimizing energy consumption during recycling. PDMS panels achieve extremely low annual degradation rates (0.15–0.22%) and excellent recycling efficiencies (95–98%) compared to conventional EVA/POE laminated panels, with up to 81% of the panel weight being directly reused. This has led to a drastic reduction in the overall carbon footprint and is in line with the principles of circular economy and sustainable development goals (SDGs). The synergistic combination of long service life and efficient end-of-life processing makes this technology a cornerstone of sustainability in the photovoltaic industry. It addresses pressing environmental and socioeconomic challenges by promoting resource efficiency, reducing photovoltaic waste by up to 114 times, and enabling policies and practices that support the global energy transition.

The method of detecting deep defects in photovoltaic materials by Fourier-Transform Photocurrent Spectroscopy has gone through continuous development during the last two decades. Still, giving quantitative predictions of photovoltaic device performance is a challenging task. As new materials appear, a prediction of potentially achievable open-circuit voltage with respect to bandgap is highly desirable. From thermodynamics, a prediction can be made based on the radiative limit, neglecting non-radiative recombination and carrier transport effects. Beyond this, more accurate analysis has to be done. First, the absolute defect density has to be calculated, taking into account optical effects, such as absorption enhancement, due to scattering. Secondly, the electrical effect of thickness variation has to be addressed. We analyzed a series of state-of-the-art hydrogenated amorphous silicon solar cells of different thicknesses at different states of light soaking degradation. Based on a combination of empirical results with optical, electrical and thermodynamic simulations, we provide a predictive model of the open-circuit voltage of a device with a given defect density and absorber thickness. We observed that, rather than the defect density or thickness alone, it is their product or the total number of defects, that matters. Alternatively, including defect absorption into the thermodynamic radiative limit gives close upper bounds to the open-circuit voltage with the advantage of a much easier evaluation.