For more than 15 years, Imagine Optic have developed Extreme Ultra Violet (EUV) and X-ray Hartmann wavefront sensors for metrology and imaging applications. These sensors are compatible with a wide range of X-ray sources: from synchrotrons, Free Electron Lasers, laser-driven betatron and plasma-based EUV lasers to High Harmonic Generation. In this paper, we first describe the principle of a Hartmann sensor and give some key parameters to design a high-performance sensor. We also present different applications from metrology (for manual or automatic alignment of optics), to soft X-ray source optimization and X-ray imaging.

The Hartmann wavefront sensor is able to measure, separately and in absolute, the real δ and imaginary part β of the X-ray refractive index. While combined with tomographic setup, the Hartman sensor opens many interesting opportunities behind the direct measurement of the material density. In order to handle the different ways of using an X-ray wavefront sensor in imaging, we developed a 3D wave propagation model based on Fresnel propagator. The model can manage any degree of spatial coherence of the source, thus enabling us to model experiments accurately using tabletop, synchrotron or X-ray free-electron lasers. Beam divergence is described in a physical manner consistent with the spatial coherence. Since the Hartmann sensor can detect phase and absorption variation with high sensitivity, a precise simulation tool is thus needed to optimize the experimental parameters. Examples are displayed.

In recent years, integral imaging, a promising three-dimensional imaging technology, has attracted more and more attention for its broad applications in robotics, computational vision, and medical diagnostics. In the visible spectrum, an integral imaging system can be easily implemented by inserting a micro-lens array between a image formation optic and a pixelated detector. By using a micro-Fresnel Zone Plate (FZP) array instead of the refractive lens array, the integral imaging system can be applied in X-ray. Due to micro-scale dimensions of FZP in the array and current manufacturing techniques, the number of zones of FZP is limited. This may have an important impact on the FZP imaging performance. The paper introduces a simulation method based on the scalar diffraction theory. With the aid of this method, the effect of the number of zones on the FZP imaging performance is numerically investigated, especially the case of very small number of zones. Results of several simulation of FZP imaging are presented and show the image can be formed by a FZP with a number of zones as low as 5. The paper aims at offering a numerical approach in order to facilitate the design of FZP for integral imaging.

The Hartman wavefront sensor can be used for X-ray phase imaging with high angular resolution. The Hartmann sensor is able to retrieve both the phase and absorption from a single acquisition. The system calculates the shift in a series of apertures imaged with a detector with respect to their reference positions. In this article, the impact of the reference image on the final image quality is investigated using a laboratory setup. Deflection and absorption images of the same sample are compared using reference images acquired in air and in water. It can be easily coupled with tomographic setups to obtain 3D images of both phase and absorption. Tomographic images of a test sample are shown, where deflection images revealed details that were invisible in absorption. The findings reported in this paper can be used for the improvement of image reconstruction and for expanding the applications of X-ray phase imaging towards materials characterization and medical imaging.

Significant efforts are currently ongoing in X-ray imaging to provide multimodal imaging systems, targeting better sensitivity and specificity for both biomedical or non-destructive testing applications. Knowing the elemental composition of specific structures, such as breast microcalcifications in mammography, would help to differentiate malign and benign tumours. Standard X-ray Phase Contrast Imaging techniques provide only qualitative information on elements with similar absorption properties. However, their chemical composition can be determined from the measurement of the phase as it is directly related to the optical index of elemental materials. We will show new experimental results obtained with an X-ray phase imaging system based on a Hartmann mask. Early data treatment succeeded in retrieving both the real and imaginary parts of the refractive index. The system demonstrates the capability to discriminate materials based on elemental composition.

A focused plenoptic camera has the ability to record and separate spatial and directional information of the incoming light. Combined with the appropriate algorithm, a 3D scene could be reconstructed from a single acquisition, over a depth range called plenoptic depth-of-field. In this Letter, we study the contrast variations with depth as a way to assess plenoptic depth-of-field. We take into account the impact of diffraction, defocus, and magnification on the resulting contrast. We measure the contrast directly on both simulated and acquired images. We demonstrate the importance of diffraction and magnification in the final contrast. Contrary to classical optics, the maximum of contrast is not centered around the main object plane, but around a shifted position, with a fast and nonsymmetric decrease of contrast.