David Busek

Dr. David Busek

Czech Technical University in Prague
orcid

Research Focus & Metrics

Academic Career Length

22Years (2005-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 May 2016 in Microelectronics Reliability
Verified
Journal Article
Closed access
DBDavid Busek
David Busek
KDKarel Dušek
Karel Dušek
DRD. Růžička
D. Růžička
MPM. Plaček
M. Plaček
PMP. Mach
P. Mach
JSJ. Starý
J. Starý

8 January 2018 in Circuit World
Verified
Journal Article
Closed access
PVPetr Veselý
Petr Veselý
EHEva Horynová
Eva Horynová
JSJiří Starý
Jiří Starý
DBDavid Busek
David Busek
KDKarel Dušek
Karel Dušek
MDMilan Dosedla
Milan Dosedla
Purpose: The purpose of this paper is to increase the reliability of manufactured electronics and to reveal reliability significant factors. The experiments were focused especially on the influence of the reflow oven parameters presented by a heating factor. Design/methodology/approach: The shear strength of the surface mount device (SMD) resistors and their joint resistance were analyzed. The resistors were assembled with two Sn/Ag/Cu-based and one Bi-based solder pastes, and the analysis was done for several values of the heating factor and before and after isothermal aging. The measurement of thickness of intermetallic compounds was conducted on the micro-sections of the solder joints. Findings: The shear strength of solder joints based on the Sn/Ag/Cu-based solder alloy started to decline after the heating factor reached the value of 500 s · K, whereas the shear strength of the solder alloy based on the Bi alloy (in the measured range) always increased with an increase in the heating factor. Also, the Bi-based solder joints showed shear strength increase after isothermal aging in contrast to Sn/Ag/Cu-based solder joints, which showed shear strength decrease. Originality/value: The interpretation of the results of such a comprehensive measurement leads to a better understanding of the mutual relation between reliability and other technological parameters such as solder alloy type, surface finish and parameters of the soldering process.

1 January 2020 in Journal of Materials Processing Technology
Verified
Journal Article
Closed access
PVPetr Veselý
Petr Veselý
DBDavid Busek
David Busek
OKO. Krammer
O. Krammer
KDK. Dušek
K. Dušek

1 October 2016 in International Journal of Heat and Mass Transfer
Verified
Journal Article
Closed access
BIBalázs Illés
Balázs Illés
AGAttila Géczy
Attila Géczy
SASkwarek Agata
Skwarek Agata
DBDavid Busek
David Busek

1 January 2016 in Microelectronics Reliability
Verified
Journal Article
Closed access
KDKarel Dušek
Karel Dušek
DBDavid Busek
David Busek

1 December 2018 in Journal of Materials Processing Technology
Verified
Journal Article
Closed access
OKOliver Krammer
Oliver Krammer
BGBenjámin Gyarmati
Benjámin Gyarmati
ASAndrás Szilágyi
András Szilágyi
BIBalázs Illés
Balázs Illés
DBDavid Busek
David Busek
KDKarel Dušek
Karel Dušek