A terahertz (THz) imaging system based on narrow band microbolometer sensors (NBMS) and a novel diffractive lens was developed for spectroscopic microscopy applications. The frequency response characteristics of the THz antenna-coupled NBMS were determined employing Fourier transform spectroscopy. The NBMS was found to be a very sensitive frequency selective sensor which was used to develop a compact all-electronic system for multispectral THz measurements. This system was successfully applied for principal components analysis of optically opaque packed samples. A thin diffractive lens with a numerical aperture of 0.62 was proposed for the reduction of system dimensions. The THz imaging system enhanced with novel optics was used to image for the first time non-neoplastic and neoplastic human colon tissues with close to wavelength-limited spatial resolution at 584 GHz frequency. The results demonstrated the new potential of compact RT THz imaging systems in the fields of spectroscopic analysis of materials and medical diagnostics.

Structured light – electromagnetic waves with a strong spatial inhomogeneity of amplitude, phase, and polarization – has occupied far-reaching positions in both optical research and applications. Terahertz (THz) waves, due to recent innovations in photonics and nanotechnology, became so robust that it was not only implemented in a wide variety of applications such as communications, spectroscopic analysis, and non-destructive imaging, but also served as a low-cost and easily implementable experimental platform for novel concept illustration. In this work, we show that structured nonparaxial THz light in the form of Airy, Bessel, and Gaussian beams can be generated in a compact way using exclusively silicon diffractive optics prepared by femtosecond laser ablation technology. The accelerating nature of the generated structured light is demonstrated via THz imaging of objects partially obscured by an opaque beam block. Unlike conventional paraxial approaches, when a combination of a lens and a cubic phase (or amplitude) mask creates a nondiffracting Airy beam, we demonstrate simultaneous lensless nonparaxial THz Airy beam generation and its application in imaging system. Images of single objects, imaging with a controllable placed obstacle, and imaging of stacked graphene layers are presented, revealing hence potential of the approach to inspect quality of 2D materials. Structured nonparaxial THz illumination is investigated both theoretically and experimentally with appropriate extensive benchmarks. The structured THz illumination consistently outperforms the conventional one in resolution and contrast, thus opening new frontiers of structured light applications in imaging and inverse scattering problems, as it enables sophisticated estimates of optical properties of the investigated structures.

Multilevel phase Fresnel lenses (MPFLs) with a high numerical aperture for 0.58 THz frequencies were developed. The components based on a monocrystalline silicon wafer are prepared by patterning by a high-speed industrial-scale laser direct writing (LDW) system. Two consistent series of the terahertz-MPFLs with phase quantization levels varying between 2 and the continuous kinoform shape for the focal lengths of 5 and 10 mm were produced employing inherent flexibility of the LDW fabrication process. The focusing performance was studied at the optimal 0.58 THz frequency using a Gaussian beam profile and scanning 2D intensity distribution with a terahertz detector along the optical axis. The efficiency of the terahertz-MPFL was found to be dependent of the number of subzones. The position and orientation angles of the patterned plane of the silicon wafer were considered to reduce the effect of standing waves formation in the experiment.

Bessel terahertz (THz) imaging employing a pair of thin silicon multi-phase diffractive optical elements is demonstrated in continuous wave mode at 0.6 THz. A proposed Bessel zone plate (BZP) design – discrete axicon containing 4 phase quantization levels – based on high-resistivity silicon and produced by laser ablation technology allowed to extend the focal depth up to 20 mm with minimal optical losses and refuse employment of bulky parabolic mirrors in the imaging setup. Compact THz imaging system in transmission geometry reveals a possibility to inspect objects of more than 10 mm thickness with enhanced contrast and increased resolution up to 0.6 of the wavelength by applying deconvolution algorithms.

Numerical simulations and experimental characterization of laser-ablated focusing antireflective and phase-shifting structures for terahertz frequencies are presented. More than 10% shift of reflectance minimum to lower frequencies was predicted by simulations for relatively coarse structures with the period of 100 μm in comparison with that of a substantially smaller period and with results of the model used for the design of antireflective surfaces in the terahertz range. Such a shift of the resonance frequency can be employed to optimize the thickness of antireflective layers simultaneously obtaining additional means of more precise control of layer properties due to ablation of larger structures. Nearly 90% transmittance of silicon wafers within 0.5-0.6 THz frequencies was confirmed experimentally. Optical path differences equivalent to a half period at 0.53 THz, suitable for applications in high-efficiency zone plates, were demonstrated with high transmittance simultaneously. Possibilities of delay adjustment up to one wavelength were illustrated by numerical simulations. A focusing binary zone plate for 0.6 THz was produced employing phase-shift differences of the dual-function antireflective layer. Its close to diffraction-limited focusing performance was evaluated, further confirming sufficient uniformity of the structured layer.