Institute of Microelectronics Technology and High-Purity Materials, Russian Academy of Sciences. Received a degree in microelectronics and semiconductor devices from the MIET Department of Electronics and Computer Technology in 1997, and a Ph.D. degree on the topic “Planar silicon parabolic lenses for hard X-ray radiation” in 2003. He works as a Senior Researcher at IMT RAS. He has authored more than 60 scientific publications. His research interests include X-ray optics and X-ray tomography.
Institute of Microelectronics Technology and High-Purity Materials, Russian Academy of Sciences. Received a degree in microelectronics and semiconductor devices from the MIET Department of Electronics and Computer Technology in 1997, and a Ph.D. degree on the topic “Planar silicon parabolic lenses for hard X-ray radiation” in 2003. He works as a Senior Researcher at IMT RAS. He has authored more than 60 scientific publications. His research interests include X-ray optics and X-ray tomography.