Prof. Dr. Hongxia Liu received a B.S. degree in Microelectronics from North West University, Xi’an, China, in 1990, an M.S. degree in Microelectronics from Xi’an Jiaotong University, Xi’an, in 1995, and a Ph.D. degree in Microelectronics from Xidian University, Xi’an, in 2002. She has been a professor of Microelectronics at Xidian University since 2002. She was a senior visiting professor at Vanderbilt University (2011) and the University of Florida (2015). She has served as chair of several international conferences and program committees. Her current research interests include advanced CMOS device designs and reliability.
Research Keywords & Expertise
Radiation Effects
Nanomaterilas
Physics of microelectr...
Reliability of microel...
Wide band gap semicond...
Short Biography
Prof. Dr. Hongxia Liu received a B.S. degree in Microelectronics from North West University, Xi’an, China, in 1990, an M.S. degree in Microelectronics from Xi’an Jiaotong University, Xi’an, in 1995, and a Ph.D. degree in Microelectronics from Xidian University, Xi’an, in 2002. She has been a professor of Microelectronics at Xidian University since 2002. She was a senior visiting professor at Vanderbilt University (2011) and the University of Florida (2015). She has served as chair of several international conferences and program committees. Her current research interests include advanced CMOS device designs and reliability.
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