Salvatore Cascino

Dr. Salvatore Cascino


Research Focus & Metrics

Academic Career Length

9Years (2018-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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15 July 2018 in Sensors
Verified
Journal Article
Open access
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Salvatore TudiscoSalvatore Tudisco
Salvatore Tudisco
Francesco La ViaFrancesco La Via
Francesco La Via
Clementina AgodiClementina Agodi
Clementina Agodi
CACarmen Altana
Carmen Altana
GBGiacomo Borghi
Giacomo Borghi
AZAnd M. Zimbone
And M. Zimbone
Silicon carbide (SiC) is a compound semiconductor, which is considered as a possible alternative to silicon for particles and photons detection. Its characteristics make it very promising for the next generation of nuclear and particle physics experiments at high beam luminosity. Silicon Carbide detectors for Intense Luminosity Investigations and Applications (SiCILIA) is a project starting as a collaboration between the Italian National Institute of Nuclear Physics (INFN) and IMM-CNR, aiming at the realization of innovative detection systems based on SiC. In this paper, we discuss the main features of silicon carbide as a material and its potential application in the field of particles and photons detectors, the project structure and the strategies used for the prototype realization, and the first results concerning prototype production and their performance.

30 May 2024 in Energies
Verified
Journal Article
Open access
PDF file
GPGiuseppe Pennisi
Giuseppe Pennisi
Mario PulvirentiMario Pulvirenti
Mario Pulvirenti
LSLuciano Salvo
Luciano Salvo
ASAngelo Giuseppe Sciacca
Angelo Giuseppe Sciacca
SCSalvatore Cascino
Salvatore Cascino
Santi Agatino RIZZOSanti Agatino RIZZO
Santi Agatino RIZZO
This paper investigates the behavior of SiC MOSFETs body diode reverse recovery as a function of different operating conditions. The knowledge of their effects is crucial to properly designing and driving power converters based on SiC devices, in order to optimize the MOSFETs commutations aiming at improving efficiency. Indeed, reverse recovery is a part of the switching transient, but it has a significant role due to its impact on recovery energy and charge. The set of different operating conditions has been properly chosen to prevent or force the snappy recovery of the device under testing. The experimental results and specific software simulations have revealed phenomena unknown in the literature. More specifically, the analysis of the reverse recovery charge, Qrr, revealed two unexpected phenomena at high temperatures: it decreased with increasing gate voltage; the higher the device threshold, the higher the Qrr. TCAD-Silvaco (ATLAS v. 5.29.0.C) simulations have shown that this is due to a displacement current flowing in the drift region due to the output capacitance voltage variation during commutation. From the analysis of the snappy recovery, it has emerged that there is a minimum forward current slope, below which the reverse recovery cannot be snappy, even for a high current level. Once this current slope is reached, Qrr varies with the forward current only.