In this paper a new basic cell for low-power and/or low-voltage operation is identified. It is shown that different versions of this cell, called "flipped voltage follower", have been used in the past for different applications. New circuits using this cell are also proposed here.

Pulsed laser testing is a useful technique for an accurate inspection of potential weak zones in a layout of an integrated circuit. A laser pulse can provoke a similar effect as a particle hitting with the advantage of a perfect location of the hitting point. The present work describes a general method to determine a Pulsed Laser Single Event Upset (SEU) Cross Section over digital circuits by means of counting statistics. The technique is based on a coincidence detector that counts fault events by comparing synchronous outputs of the digital circuit under test and a replica of the design running on a control FPGA. A correspondence map, previously generated by injection fault analysis techniques on the replica, establishes a one-way correspondence between output patterns and each bit flip. With this scheme, the SEU is detected dynamically just using a comparison between the running model and the circuit.

Trends show that next coming technologies will produce new generations of very large circuits, running at high clock rates. Some critical applications will have to be protected against the remaining radiation at sea level. This is especially important in aerospace applications because ionizing radiation produces corruption of the internal state. New design methods have to be introduced to assure circuits will tolerate the impact of single event effects (SEE). It is very important to be able to analyze which parts of the circuits are more critical and how the behavior of the global system is degraded when one part suffers a SEE. This paper presents the last functionalities added to the FT-UNSHADES system to extend the analysis to SETs and MBUs. As a result, the system can insert and analyze many fault types at a rate of 180 K faults per hour in a system with 2 million test vectors.