Tang Junjian,Associate Research Fellow in School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China.
Educational experience:
1. PhD in Engineering, 2022, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China.
2. Bachelor's degree in Engineering, 2017, School of Mechanical Engineering, Shandong University.
Work experience:
1. 2022.07-2025.03, Postdoctor in the School of Physics, Beihang University, Beijing, China;
2. 2025.04- Associate Research Fellow in School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China.
Professional Associations:
Journal Publications: Authored over 20 papers in journals, with 19 as the first or corresponding author and 1 ESI Highly Cited Paper.
Patents: Applied for 10 Chinese patents.
Peer Reviewer: Actively engaged in reviewing submissions for over 20 scientific journals, (e.g., IEEE Transactions on Instrumentation and Measurement, IEEE Sensors Journal, Measurement Science and Technology, Optics Express, Nanotechnology, Optics Letters), contributing to the academic peer-review process.
Professional Memberships: Member of the China Instrument and Instrumentation Society, Member of the China Metrology and Testing Society.
Tang Junjian,Associate Research Fellow in School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China.
Educational experience:
1. PhD in Engineering, 2022, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China.
2. Bachelor's degree in Engineering, 2017, School of Mechanical Engineering, Shandong University.
Work experience:
1. 2022.07-2025.03, Postdoctor in the School of Physics, Beihang University, Beijing, China;
2. 2025.04- Associate Research Fellow in School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China.
Professional Associations:
Journal Publications: Authored over 20 papers in journals, with 19 as the first or corresponding author and 1 ESI Highly Cited Paper.
Patents: Applied for 10 Chinese patents.
Peer Reviewer: Actively engaged in reviewing submissions for over 20 scientific journals, (e.g., IEEE Transactions on Instrumentation and Measurement, IEEE Sensors Journal, Measurement Science and Technology, Optics Express, Nanotechnology, Optics Letters), contributing to the academic peer-review process.
Professional Memberships: Member of the China Instrument and Instrumentation Society, Member of the China Metrology and Testing Society.