Thomas Moxham

Mr. Thomas Moxham


Research Focus & Metrics

Academic Career Length

7Years (2020-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 June 2021 in Materials Today Communications
Verified
Journal Article
Open access
CBCyril Besnard
Cyril Besnard
RHRobert A. Harper
Robert A. Harper
TMThomas Moxham
Thomas Moxham
JJJonathan D. James
Jonathan D. James
MSMalte Storm
Malte Storm
Alexander KorsunskyAlexander Korsunsky
Alexander Korsunsky

20 May 2020 in Polymers
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Journal Article
Open access
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BJBenjamin de Jager
Benjamin de Jager
TMThomas Moxham
Thomas Moxham
CBCyril Besnard
Cyril Besnard
Enrico SalvatiEnrico Salvati
Enrico Salvati
JCJingwei Chen
Jingwei Chen
Alexander KorsunskyAlexander Korsunsky
Alexander Korsunsky
Nylon-12 is an important structural polymer in wide use in the form of fibres and bulk structures. Fused filament fabrication (FFF) is an extrusion-based additive manufacturing (AM) method for rapid prototyping and final product manufacturing of thermoplastic polymer objects. The resultant microstructure of FFF-produced samples is strongly affected by the cooling rates and thermal gradients experienced across the part. The crystallisation behaviour during cooling and solidification influences the micro- and nano-structure, and deserves detailed investigation. A commercial Nylon-12 filament and FFF-produced Nylon-12 parts were studied by differential scanning calorimetry (DSC) and wide-angle X-ray scattering (WAXS) to examine the effect of cooling rates under non-isothermal crystallisation conditions on the microstructure and properties. Slower cooling rates caused more perfect crystallite formation, as well as alteration to the thermal properties.

19 October 2020 in Journal of Synchrotron Radiation
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Journal Article
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VDVishal Dhamgaye
Vishal Dhamgaye
DLDavid Laundy
David Laundy
SBSara Baldock
Sara Baldock
TMThomas Moxham
Thomas Moxham
Kawal SawhneyKawal Sawhney
Kawal Sawhney
A refractive phase corrector optics is proposed for the compensation of fabrication error of X-ray optical elements. Here, at-wavelength wavefront measurements of the focused X-ray beam by knife-edge imaging technique, the design of a three-dimensional corrector plate, its fabrication by 3D printing, and use of a corrector to compensate for X-ray lens figure errors are presented. A rotationally invariant corrector was manufactured in the polymer IP-STM using additive manufacturing based on the two-photon polymerization technique. The fabricated corrector was characterized at the B16 Test beamline, Diamond Light Source, UK, showing a reduction in r.m.s. wavefront error of a Be compound refractive Lens (CRL) by a factor of six. The r.m.s. wavefront error is a figure of merit for the wavefront quality but, for X-ray lenses, with significant X-ray absorption, a form of the r.m.s. error with weighting proportional to the transmitted X-ray intensity has been proposed. The knife-edge imaging wavefront-sensing technique was adapted to measure rotationally variant wavefront errors from two different sets of Be CRL consisting of 98 and 24 lenses. The optical aberrations were then quantified using a Zernike polynomial expansion of the 2D wavefront error. The compensation by a rotationally invariant corrector plate was partial as the Be CRL wavefront error distribution was found to vary with polar angle indicating the presence of non-spherical aberration terms. A wavefront correction plate with rotationally anisotropic thickness is proposed to compensate for anisotropy in order to achieve good focusing by CRLs at beamlines operating at diffraction-limited storage rings.

8 March 2021 in Applied Physics Letters
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Journal Article
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TMThomas Moxham
Thomas Moxham
DLDavid Laundy
David Laundy
VDVishal Dhamgaye
Vishal Dhamgaye
OFOliver J. L. Fox
Oliver J. L. Fox
Kawal SawhneyKawal Sawhney
Kawal Sawhney
Alexander KorsunskyAlexander Korsunsky
Alexander Korsunsky
Ptychography is a scanning coherent diffraction imaging technique that provides high-resolution imaging and complete spatial information of the complex probe and object transmission function. The wavefront error caused by aberrated optics has previously been recovered using ptychography when a highly coherent source is used, but has not been demonstrated with partial coherence due to the multi-modal probe required. Here, we demonstrate that partial coherence can be accounted for in ptychographic reconstructions using the multi-modal approach and assuming that decoherence arises from either the probe or the object. This equivalence recovers coherent (or single state) reconstructions of both the probe and the object even in the presence of partial coherence. We demonstrate this experimentally by using hard x-ray ptychography with a partially coherent source to image a Siemens star test object and to also recover the wavefront error from an aberrated beryllium compound refractive lens. The source properties and resolving capabilities are analyzed, and the wavefront error results are compared with another at-wavelength metrology technique. Our work demonstrates the capability of ptychography to provide high-resolution imaging and optics characterization even in the presence of partial coherence.

16 October 2020 in Journal of Synchrotron Radiation
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TMThomas Moxham
Thomas Moxham
APAaron Parsons
Aaron Parsons
TZTunhe Zhou
Tunhe Zhou
LALucia Alianelli
Lucia Alianelli
HWHongchang Wang
Hongchang Wang
Alexander KorsunskyAlexander Korsunsky
Alexander Korsunsky
Ptychography is a scanning coherent diffraction imaging technique which provides high resolution imaging and complete spatial information of the complex electric field probe and sample transmission function. Its ability to accurately determine the illumination probe has led to its use at modern synchrotrons and free-electron lasers as a wavefront-sensing technique for optics alignment, monitoring and correction. Recent developments in the ptychography reconstruction process now incorporate a modal decomposition of the illuminating probe and relax the restriction of using sources with high spatial coherence. In this article a practical implementation of hard X-ray ptychography from a partially coherent X-ray source with a large number of modes is demonstrated experimentally. A strongly diffracting Siemens star test sample is imaged using the focused beam produced by either a Fresnel zone plate or beryllium compound refractive lens. The recovered probe from each optic is back propagated in order to plot the beam caustic and determine the precise focal size and position. The power distribution of the reconstructed probe modes also allows the quantification of the beams coherence and is compared with the values predicted by a Gaussian–Schell model and the optics exit intensity.

9 August 2020 in Quantum Beam Science
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Journal Article
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Eugene StatnikEugene Statnik
Eugene Statnik
Alexey I. SalimonAlexey I. Salimon
Alexey I. Salimon
CBCyril Besnard
Cyril Besnard
JCJingwei Chen
Jingwei Chen
ZWZifan Wang
Zifan Wang
Alexander KorsunskyAlexander Korsunsky
Alexander Korsunsky
Bone is a natural hierarchical composite tissue incorporating hard mineral nano-crystals of hydroxyapatite (HAp) and organic binding material containing elastic collagen fibers. In the study, we investigated the structure and deformation of ovine bone by the combination of high-energy synchrotron X-ray tomographic imaging and scattering. X-ray experiments were performed prior to and under three-point bending loading by using a specially developed in situ load cell constructed from aluminium alloy frame, fast-drying epoxy resin for sample fixation, and a titanium bolt for contact loading. Firstly, multiple radiographic projection images were acquired and tomographic reconstruction was performed using SAVU software, following segmentation using Avizo. Secondly, Wide Angle X-ray Scattering (WAXS) and Small Angle X-ray Scattering (SAXS) 2D scattering patterns were collected from HAp and collagen. Both sample shape and deformation affect the observed scattering. Novel combined tomographic and diffraction analysis presented below paves the way for advanced characterization of complex shape samples using the Dual Imaging and Diffraction (DIAD) paradigm.