The properties of Sn99Ag0.3Cu0.7 (SACX0307) solder alloy reinforced with ZnO nanoparticles were investigated. The primary ZnO particle sizes were 50, 100, and 200 nm. They were added to a solder paste at a ratio of 1.0 wt %. The wettability, the void formation, the mechanical strength, and the thermoelectric parameters of the composite solder alloys/joints were investigated. Furthermore, microstructural evaluations were performed using scanning electron and ion microscopy. ZnO nanoparticles decreased the composite solder alloys’ wettability, which yielded increased void formation. Nonetheless, the shear strength and the thermoelectric parameters of the composite solder alloy were the same as those of the SACX0307 reference. This could be explained by the refinement effects of ZnO ceramics both on the Sn grains and on the Ag₃Sn and Cu₆Sn₅ intermetallic grains. This could compensate for the adverse impact of lower wettability. After improving the wettability, using more active fluxes, ZnO composite solder alloys are promising for high-power applications.

Purpose: The aim of this paper is to present a review of the tin whisker growth phenomena. The study focuses mainly on whisker growth in a corrosive climate when the main inducing factor of the whisker growth is oxidation. The tin whisker phenomenon is still a big challenge in lead-free reflow soldering technology. Modern lead-free alloys and surface finishes with high tin content are considered to be possible sources of whisker development, also the evolution of electronic devices towards further complexity and miniaturization points to an escalation of the reliability risks. Design/methodology/approach: The present work was based on a worldwide literature review of the substantial previous works in the past decade, as well as on the results and experience of the authors in this field. Findings: The effect of corrosion on tin whisker growth has been under-represented in reports of mainstream research; however, in the past five years, significant results were obtained in the field which raised the corrosion phenomena from being a side effect category into one of the main inducing factors. This paper summarizes the most important findings of this field. Practical implications: This literature review provides engineers and researchers with a better understanding of the role of corrosion in tin whisker growth and the current challenges in tin whisker mitigation. Originality/value: The unique challenges and future research directions about the tin whisker phenomenon were shown to highlight rarely discussed risks and problems in lead-free soldering reliability.

Purpose: This paper aims to present a robust prediction method for estimating the quality of electronic products assembled with pin-in-paste soldering technology. A specific board quality factor was also defined which describes the expected yield of the board assembly.Design/methodology/approach: Experiments were performed to obtain the required input data for developing a prediction method based on decision tree learning techniques. A Type 4 lead-free solder paste (particle size 20–38 µm) was deposited by stencil printing with different printing speeds (from 20 mm/s to 70 mm/s) into the through-holes (0.8 mm, 1 mm, 1.1 mm, 1.4 mm) of an FR4 board. Hole-filling was investigated with X-ray analyses. Three test cases were evaluated.Findings: The optimal parameters of the algorithm were determined as: subsample is 0.5, learning rate is 0.001, maximum tree depth is 6 and boosting iteration is 10,000. The mean absolute error, root mean square error and mean absolute percentage error resulted in 0.024, 0.03 and 3.5, respectively, on average for the prediction of the hole-filling value, based on the printing speed and hole-diameter after optimisation. Our method is able to predict the hole-filling in pin-in-paste technology for different through-hole diameters.Originality/value: No research works are available in current literature regarding machine learning techniques for pin-in-paste technology. Therefore, we decided to develop a method using decision tree learning techniques for supporting the design of the stencil printing process for through-hole components and pin-in-paste technology. The first pass yield of the assembly can be enhanced, and the reflow soldering failures of pin-in-paste technology can be significantly reduced.

Purpose: This paper aims to present a new method to calculate the appropriate volume of solder paste necessary for the pin-in-paste (PIP) technology. By the aid of this volume calculation, correction factors have been determined, which can be used to correct the solder fillet volume obtained by an explicit expression. Design/methodology/approach: The method is based on calculating the optimal solder fillet shape and profile for through-hole (TH) components with given geometrical sizes. To calculate this optimal shape of the fillet, a script was written in Surface Evolver. The volume calculations were performed for different fillet radiuses (0.4-1.2 mm) and for different component lead geometries (circular and square cross-sections). Finally, the volume obtained by the Evolver calculations was divided by the volume obtained by an explicit expression, and correction factors were determined for the varying parameters. Findings: The results showed that the explicit expression underestimates the fillet volume necessary for the PIP technology significantly (15-35 per cent). The correction factors for components with circular leads ranged between 1.4 and 1.59, whereas the correction factors for square leads ranged between 1.1 and 1.27. Applying this correction can aid in depositing the appropriate solder paste volume for TH components. Originality/value: Determining the correct volume of solder paste necessary for the PIP technology is crucial to eliminate the common soldering failure of TH components (e.g. voiding or non-wetted solder pads). The explicit expression, which is widely used for volume calculation in this field, underestimates the necessary volume significantly. The new method can correct this estimation, and can aid the industry to approach zero-defect manufacturing in the PIP technology.

Flux contained in solder paste significantly affects the process of solder joint creation during reflow soldering, including the creation of an intermetallic layer (IML). This work investigates the dependence of intermetallic layer thickness on ROL0/ROL1 flux classification, glossy or matt solder mask, and OSP/HASL/ENIG soldering pad surface finish. Two original SAC305 solder pastes differing only in the used flux were chosen for the experiment. The influence of multiple reflows was also observed. The intermetallic layer thicknesses were obtained by the image analysis of micro-section images. The flux type proved to have a significant impact on the intermetallic layer thickness. The solder paste with ROL1 caused an increase in IML thickness by up to 40% in comparison to an identical paste with ROL0 flux. Furthermore, doubling the roughness of the solder mask has increased the resulting IML thickness by 37% at HASL surface finish and by an average of 22%.

The effect of copper substrate roughness and tin layer thickness were investigated on whisker development in the case of Sn thin-films. Sn was vacuum-evaporated onto both unpolished and mechanically polished Cu substrates with 1 µm and 2 μm average layer thicknesses. The samples were stored in room conditions for 60 days. The considerable stress—developed by the rapid intermetallic layer formation—resulted in intensive whisker formation, even in some days after the layer deposition. The developed whiskers and the layer structure underneath them were investigated with both scanning electron microscopy and ion microscopy. The Sn thin-film deposited onto unpolished Cu substrate produced less but longer whiskers than that deposited onto polished Cu substrate. This phenomenon might be explained by the dependence of IML formation on the surface roughness of substrates. The formation of IML wedges is more likely on rougher Cu substrates than on polished ones. Furthermore, it was found that with the decrease of layer thickness, the development of nodule type whiskers increases due to the easier diffusion of other atoms into the whisker bodies.